Patents by Inventor Hee Lai Ang

Hee Lai Ang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Dual site loadboard tester
    Patent number: 5968193
    Abstract: A method and apparatus for testing integrated circuit devices includes a dual site loadboard (60) with dual test sites (62) for holding integrated circuit devices. The dual test sites are connected to test instruments. Integrated circuit devices are loaded onto the dual test sites and tested one at a time using the same set of pin cards (34) in a test head (30).
    Type: Grant
    Filed: May 27, 1997
    Date of Patent: October 19, 1999
    Assignee: Integrated Device Technology, Inc.
    Inventor: Hee Lai Ang