Abstract: The present disclosure provides a display device that includes an insulating layer disposed on a substrate. The display device further includes a plurality of first electrodes and contact electrodes disposed on the insulating layer. The display device further includes a plurality of light-emitting elements disposed on the plurality of first electrodes. The display device further includes a second electrode disposed on the plurality of light-emitting elements. The display device further includes a passivation layer covering the first electrode. The display device further includes a first opening hole at the passivation layer. The first opening hole extends through the passivation layer. The passivation layer has a first opening hole exposing a portion of an upper surface of the first electrode.

Abstract: The present application relates to a microorganism in which an activity of erythronate-4-phosphate dehydrogenase is weakened; a method for producing O-phosphoserine, cysteine, or cysteine derivatives using the microorganism; a composition for producing O-phosphoserine comprising the microorganism; and the use of the microorganism in the production of O-phosphoserine, cysteine, and cysteine derivatives.

Abstract: The present invention provides an organic emitting diode including a first electrode; a second electrode facing the first electrode; an emitting material layer between the first and second electrodes; and an intervening layer between the emitting material layer and the second electrode and including a base material and an electron injection material, wherein the intervening layer contacts the second electrode.

Abstract: A display device includes: a light emitting element on a base layer and including a first electrode, a second electrode, and a light emitting part electrically connected between the first electrode and the second electrode; a pixel defining layer on the base layer; a barrier layer on the pixel defining layer; and an electrode on the barrier layer, wherein the first electrode includes a (1_1)-th electrode and a (1_2)-th electrode, the pixel defining layer is between the (1_1)-th electrode and the (1_2)-th electrode, the light emitting part includes a first light emitting part electrically connected to the (1_1)-th electrode and a second light emitting part electrically connected to the (1_2)-th electrode, and the electrode and the barrier layer are between the first light emitting part and the second light emitting part in a plan view.

Abstract: A method of interpolating a signal output from an image sensor including a pixel array having an M×N matrix as a basic pixel block where M and N are integers is provided. The method includes selecting a target pixel signal from among pixel signals output from the basic pixel block; and converting a pattern of a pixel signal output from the pixel array into a Bayer pattern by converting a pixel signal output from the basic pixel block into the Bayer pattern through an operation on the target pixel signal and a neighboring pixel signal of the target pixel signal and interpolating an output signal converted into the Bayer pattern.

Abstract: A method of interpolating a signal output from an image sensor including a pixel array having an M×N matrix as a basic pixel block where M and N are integers is provided. The method includes selecting a target pixel signal from among pixel signals output from the basic pixel block; and converting a pattern of a pixel signal output from the pixel array into a Bayer pattern by converting a pixel signal output from the basic pixel block into the Bayer pattern through an operation on the target pixel signal and a neighboring pixel signal of the target pixel signal and interpolating an output signal converted into the Bayer pattern.

Abstract: A semiconductor integrated circuit including a plurality of cores and/or a plurality of user defined logic (UDL) circuits, also includes a scan signal converting circuit to generate a plurality of scan signals to test the cores and/or the circuits adopting various scan styles in core-based design. The scan signal converting circuit converts scan signals corresponding one of the scan styles into various scan signals to control shift and normal operation of the embedded plural cores and/or the UDL circuits. As a result, the integrated circuit having a plurality of cores and/or the UDL circuits can be tested by the generated various scan signals from the scan signal converting circuit, under control of the scan signals corresponding to one of the scan styles. Therefore, the integrated circuit can easily perform test algorithms such as automatic test-pattern generation (ATPG) algorithm, and the like.

Abstract: A semiconductor integrated circuit including a plurality of cores and/or a plurality of user defined logic (UDL) circuits, also includes a scan signal converting circuit to generate a plurality of scan signals to test the cores and/or the circuits adopting various scan styles in core-based design. The scan signal converting circuit converts scan signals corresponding one of the scan styles into various scan signals to control shift and normal operation of the embedded plural cores and/or the UDL circuits. As a result, the integrated circuit having a plurality of cores and/or the UDL circuits can be tested by the generated various scan signals from the scan signal converting circuit, under control of the scan signals corresponding to one of the scan styles. Therefore, the integrated circuit can easily perform test algorithms such as automatic test-pattern generation (ATPG) algorithm, and the like.