Patents by Inventor Hee Ok Jang

Hee Ok Jang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for fabricating probe for use in scanning probe microscope
    Patent number: 7767101
    Abstract: A method of fabricating a probe tip for use in a scanning probe microscope, includes the steps of: forming a triangular prism provided with a passivation film by patterning a {111} general silicon wafer, the passivation film being deposited on two sidewalls of the triangular prism; etching the silicon wafer to make the triangular prism into a probe tip of a triangular pyramid shape; and removing the passivation film.
    Type: Grant
    Filed: May 24, 2007
    Date of Patent: August 3, 2010
    Assignee: M2N Inc.
    Inventors: Young Geun Park, Hee Ok Jang
  • METHOD FOR FABRICATING PROBE FOR USE IN SCANNING PROBE MICROSCOPE
    Publication number: 20080272087
    Abstract: A method of fabricating a probe tip for use in a scanning probe microscope, includes the steps of: forming a triangular prism provided with a passivation film by patterning a {111} general silicon wafer, the passivation film being deposited on two sidewalls of the triangular prism; etching the silicon wafer to make the triangular prism into a probe tip of a triangular pyramid shape; and removing the passivation film.
    Type: Application
    Filed: May 24, 2007
    Publication date: November 6, 2008
    Applicant: M2N INC.
    Inventors: Young Geun Park, Hee Ok Jang