Abstract: A semiconductor device includes: a substrate includes an active area; a gate structure intersecting the active area; a source/drain area disposed on the active area, a lower contact disposed on the source/drain area or the gate structure; an upper contact disposed on the lower contact; and a plurality of conductive lines disposed on the upper contact, wherein the plurality of conductive lines extend in a first direction parallel to an upper surface of the substrate, wherein the plurality of conductive lines includes a first conductive line disposed on the upper contact, wherein a size in the first direction of the lower contact is smaller than a size in the first direction of the upper contact, wherein a size in a second direction of the lower contact is greater than a size in the second direction of the upper contact, wherein the second direction intersects the first direction.

Abstract: A semiconductor device includes a substrate including a resistor region, a plurality of lower patterns in the resistor region, and a resistor line pattern on the plurality of lower patterns and the substrate of the resistor region. The plurality of lower patterns extend in a first direction parallel to a surface of the substrate and are spaced apart from each other in a second direction perpendicular to the first direction and parallel to the surface of the substrate. The resistor line pattern extends in the second direction. The resistor line pattern on the lower patterns has an upper surface and a lower surface protruding in a third direction perpendicular to the surface of the substrate.

Abstract: Provided is a three-dimensional semiconductor memory device. The device may include a substrate that includes a cell array region and a connection region; an electrode structure provided on the substrate to extend in a first direction and include electrodes that are vertically stacked on the substrate and include pad portions which are stacked on the connection region to have a staircase structure; cell vertical structures provided on the cell array region to penetrate the electrode structure; dummy vertical structures provided on the connection region to penetrate the pad portion of each electrode; and cell contact plugs coupled to the pad portions of the electrodes. Each cell contact plug may have a non-circular top surface, and the dummy vertical structures may be arranged to surround each cell contact plug, in a plan view.

Abstract: A semiconductor device includes a substrate including a resistor region, a plurality of lower patterns in the resistor region, and a resistor line pattern on the plurality of lower patterns and the substrate of the resistor region. The plurality of lower patterns extend in a first direction parallel to a surface of the substrate and are spaced apart from each other in a second direction perpendicular to the first direction and parallel to the surface of the substrate. The resistor line pattern extends in the second direction. The resistor line pattern on the lower patterns has an upper surface and a lower surface protruding in a third direction perpendicular to the surface of the substrate.

Abstract: Provided is a three-dimensional semiconductor memory device. The device may include a substrate that includes a cell array region and a connection region; an electrode structure provided on the substrate to extend in a first direction and include electrodes that are vertically stacked on the substrate and include pad portions which are stacked on the connection region to have a staircase structure; cell vertical structures provided on the cell array region to penetrate the electrode structure; dummy vertical structures provided on the connection region to penetrate the pad portion of each electrode; and cell contact plugs coupled to the pad portions of the electrodes. Each cell contact plug may have a non-circular top surface, and the dummy vertical structures may be arranged to surround each cell contact plug, in a plan view.