Abstract: In order to inspect a substrate, an image information of a substrate before applying solder is displayed. Then, at least one inspection region on the substrate is image-captured to obtain an image of the inspection region that is image-captured. Then, image information that is to be displayed is renewed and the renewed image information is displayed. And, in order to inspect a foreign substance, obtained image of the inspection region is compared with a reference image of the substrate. Therefore, an operator can easily catch a region corresponding to a specific region of the image that is displayed, and easily detect a foreign substance on the substrate.

Abstract: A system for measuring displacement of an accelerating tube by using a micro-alignment telescope, which includes a vacuum chamber; a hollow accelerating tube in the vacuum chamber; a sighting target attached to a surface of the accelerating tube while protruding from the surface of the accelerating tube; the micro-alignment telescope spaced apart from one side surface of the vacuum chamber; a first lens device interposed between the micro-alignment telescope and the vacuum chamber; and a second lens device spaced apart from an opposite side surface of the vacuum chamber by a distance, wherein the vacuum chamber includes first and second viewports placed on the surfaces of the vacuum chamber in correspondence with each other, and the micro-alignment telescope, the first lens device, the first viewport, the sighting target, the second viewport and the second lens device are aligned on a same axis in one direction.

Abstract: In order to inspect a substrate, an image information of a substrate before applying solder is displayed. Then, at least one inspection region on the substrate is image-captured to obtain an image of the inspection region that is image-captured. Then, image information that is to be displayed is renewed and the renewed image information is displayed. And, in order to inspect a foreign substance, obtained image of the inspection region is compared with a reference image of the substrate. Therefore, an operator can easily catch a region corresponding to a specific region of the image that is displayed, and easily detect a foreign substance on the substrate.

Abstract: A method of inspecting a substrate is disclosed. The method is performed by a substrate-inspecting apparatus having at least one projecting module projecting a patterned light onto a substrate fixed on a stage and an inspecting module with a camera capturing an image, and inspecting a plurality of inspection regions of the substrate step by step. The method comprises, setting an inspection order of the inspecting regions according to a lengthwise direction of the substrate, estimating height displacement of a target inspection region by using a tendency information regarding at least one previous inspection region that is already inspected, adjusting height of the inspecting module by using the estimated height displacement of the target inspection region, and inspecting the target inspection region by using the inspecting module of which height is adjusted. Therefore, inspection time is reduced.

Abstract: A method comprises providing power from a battery to an external device using a first circuit; and receiving power from a first power source to provide power to the battery using a second circuit while providing power to the external device.

Abstract: A method comprises providing power from a battery to an external device using a first circuit; and receiving power from a first power source to provide power to the battery using a second circuit while providing power to the external device.

Abstract: A system for measuring displacement of an accelerating tube by using a micro-alignment telescope, which includes a vacuum chamber; a hollow accelerating tube in the vacuum chamber; a sighting target attached to a surface of the accelerating tube while protruding from the surface of the accelerating tube; the micro-alignment telescope spaced apart from one side surface of the vacuum chamber; a first lens device interposed between the micro-alignment telescope and the vacuum chamber; and a second lens device spaced apart from an opposite side surface of the vacuum chamber by a distance, wherein the vacuum chamber includes first and second viewports placed on the surfaces of the vacuum chamber in correspondence with each other, and the micro-alignment telescope, the first lens device, the first viewport, the sighting target, the second viewport and the second lens device are aligned on a same axis in one direction.

Abstract: Methods and apparatuses are provided for an electronic device. A connection of the electronic device with a charging device is detected. A state of the electronic device is determined. One of a first charging circuit and a second charging circuit is selected based on the state of the electronic device.

Abstract: In order to inspect a board, first, a board prior to mounting an element on the board by a mounter is transferred to a work stage. Then, warpage of the board is inspected. Thereafter, in case that the board is judged good as a result of the inspection, the board is transferred to the mounter, and in case that the board is judged no good as the result of the inspection, the board is finally determined no good without transferring the board to the mounter. Thus, unnecessary works and defective products may be prevented beforehand, and productivity and efficiency of inspection may be increased.

Abstract: An electronic device is provided. The electronic device includes a first communication circuit configured to perform wireless communication with an external electronic device, based on a first communication protocol in which the wireless communication is possible based on at least one of a first frequency or a second frequency, a processor electrically connected to the communication circuit, and a memory electrically connected to the processor. The memory is configured to store instructions, the instructions, when executed, causing the processor to acquire information associated with at least one of a state or an operation of the electronic device and the first communication to perform the wireless communication selectively based on one of the first frequency or the second frequency, based on at least a part of the acquired information.

Abstract: A resonator and a method for manufacturing a resonator are provided. The method may include doping a wafer, and forming on the wafer a substrate, a drain electrode, a source electrode, a gate electrode, and at least one nanowire.

Abstract: An electronic device and a method of controlling the electronic device are provided. A memory and a processor are electrically connected with the memory. The processor controls at least one of a change in a specified operation power, a change in a specified operation clock rate, and an operation state of a diversity module of the electronic device when the electronic device enters an inactive period after an active period associated with transmitting data has ended.

Abstract: In order to inspect a substrate, an image information of a substrate before applying solder is displayed. Then, at least one inspection region on the substrate is image-captured to obtain an image of the inspection region that is image-captured. Then, image information that is to be displayed is renewed and the renewed image information is displayed. And, in order to inspect a foreign substance, obtained image of the inspection region is compared with a reference image of the substrate. Therefore, an operator can easily catch a region corresponding to a specific region of the image that is displayed, and easily detect a foreign substance on the substrate.

Abstract: Provided is an electronic device including an inputtable display that is divided into a first region and a second region in a first mode in which a layer for displaying data of the first region is displayed on the second region and a controller configured to identically apply an event occurring on the layer to the first region of the display, upon occurrence of the event on the layer.

Abstract: A manufacturing method of a laundry machine is disclosed. The manufacturing method of the laundry machine includes a suspension preparing step configured to prepare a suspension unit (40) configured to flexibly support a drum (30), a tub rear securing step configured to secure a tub rear (120) to the suspension unit (40), a drum securing step configured to a shaft (351) or the drum (30) to the suspension unit (40) via an inside of the tub rear (120), a tub front coupling step configured to couple a tub front (100) to the tub rear (120), a tub seating step configured to seat the tub front (100) and the tub rear (120) in a cabinet cabinet base (600)m and a suspension securing step configured to secure the suspension unit to the cabinet base (600).

Abstract: A method of inspecting a substrate is disclosed. The method of inspecting a substrate, comprises: obtaining phase data per projecting part with regard to a substrate, by projecting pattern beam onto the substrate having a target object formed thereon through a plurality of projecting parts in sequence; obtaining height data per projecting part with regard to the substrate by using the phase data per the projecting part; compensating tilt of the height data by using the height data per projecting part; modifying the tilt-compensated height data per projecting part; and obtaining integrated height data by using the modified height data.

Abstract: A light emitting lamp, a backlight assembly and a display device including the same are provided. The light emitting lamp includes a lamp tube longitudinally extended along an extension line, and a plurality of set electrodes disposed on a periphery of the lamp tube and along the extension line. The periphery of the lamp tube is divided into a first region and a second region by a plane including the extension line, and each of the set electrodes includes a first electrode disposed on the first region and a second electrode disposed on the second region.

Abstract: A method of inspecting a substrate is disclosed. The method is performed by a substrate-inspecting apparatus having at least one projecting module projecting a patterned light onto a substrate fixed on a stage and an inspecting module with a camera capturing an image, and inspecting a plurality of inspection regions of the substrate step by step. The method comprises, setting an inspection order of the inspecting regions according to a lengthwise direction of the substrate, estimating height displacement of a target inspection region by using a tendency information regarding at least one previous inspection region that is already inspected, adjusting height of the inspecting module by using the estimated height displacement of the target inspection region, and inspecting the target inspection region by using the inspecting module of which height is adjusted. Therefore, inspection time is reduced.

Abstract: A method comprises providing power from a battery to an external device using a first circuit; and receiving power from a first power source to provide power to the battery using a second circuit while providing power to the external device.

Abstract: A thin film transistor (TFT) substrate and a method of fabricating the same are provided. The thin film transistor substrate may have low resistance characteristics and may have reduced mutual diffusion and contact resistance between an active layer pattern and data wiring. The thin film transistor substrate may include gate wiring formed on an insulating substrate. Oxide active layer patterns may be formed on the gate wiring and may include a first substance. Data wiring may be formed on the oxide active layer patterns to cross the gate wiring and may include a second substance. Barrier layer patterns may be disposed between the oxide active layer patterns and the data wiring and may include a third substance.