Patents by Inventor Heidi Thome-Forster

Heidi Thome-Forster has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7405819
    Abstract: A sample substrate adapted for use with fluorescence excitation light with a first wavelength. A reflector is disposed on a base. The reflector includes a reflecting multilayer interference coating with at least two layers. Not all of the layers L fulfill a quarterwave condition: dL·nL=(2N+1)·¼ wherein dL is a physical thickness of layer L, nL is an index of refraction of layer L at the first wavelength, N is an integer equal to or greater than zero and 1 is the first wavelength. Thicknesses of the layers ensure that any fluorescent sample material disposed on top of said multilayer interference coating would be located near an antinode of a standing wave formed by the excitation light with the first wavelength incident on said substrate.
    Type: Grant
    Filed: April 25, 2007
    Date of Patent: July 29, 2008
    Assignee: OC Oerlikon Balzers AG
    Inventors: Jorg Kraus, Johannes Edlinger, Max Wiki, Heidi Thome-Forster, Claus Heine-Kempkens, Bernd Maisenhoelder, Martin Kaspar
  • Publication number: 20070188746
    Abstract: A sample substrate adapted for use with fluorescence excitation light with a first wavelength. A reflector is disposed on a base. The reflector includes a reflecting multilayer interference coating with at least two layers. Not all of the layers L fulfill a quarterwave condition: dL·nL=(2N+1)·¼ wherein dL is a physical thickness of layer L, nL is an index of refraction of layer L at the first wavelength, N is an integer equal to or greater than zero and 1 is the first wavelength. Thicknesses of the layers ensure that any fluorescent sample material disposed on top of said multilayer interference coating would be located near an antinode of a standing wave formed by the excitation light with the first wavelength incident on said substrate.
    Type: Application
    Filed: April 25, 2007
    Publication date: August 16, 2007
    Applicant: OC OERLIKON BALZERS AG
    Inventors: Jorg Kraus, Johannes Edlinger, Max Wiki, Heidi Thome-Forster, Claus Heine-Kempkens, Bernd Maisenhoelder, Martin Kaspar
  • Patent number: 7227633
    Abstract: A sample substrate adapted for use with fluorescence excitation light with a first wavelength. A reflector is disposed on a base. The reflector includes a reflecting multilayer interference coating with at least two layers. Not all of the layers L fulfill a quarterwave condition: dL·nL=(2N+1)·1/4 wherein dL is a physical thickness of layer L, nL is an index of refraction of layer L at the first wavelength, N is an integer equal to or greater than zero and 1 is the first wavelength. Thicknesses of the layers ensure that any fluorescent sample material disposed on top of said multilayer interference coating would be located near an antinode of a standing wave formed by the excitation light with the first wavelength incident on said substrate.
    Type: Grant
    Filed: June 2, 2004
    Date of Patent: June 5, 2007
    Assignee: OC Oerlikon Balzers AG
    Inventors: Jörg Kraus, Johannes Edlinger, Max Wiki, Heidi Thome-Forster, Claus Heine-Kempkens, Bernd Maisenhoelder, Martin Kaspar
  • Publication number: 20070014017
    Abstract: This invention relates to a platform (11) and a method for generating electromagnetic field distributions. The invention relates in particular to optical sensors for measuring biological or chemical substances. The platform (11) according to the invention comprises a substrate (13), a structured layer (19) and, positioned between the substrate (13) and the structured layer (19), a multilayer assembly (17), said components being so matched relative to one another that upon appropriate impingement by electromagnetic radiation an electromagnetic field distribution is generated that is at a maximum within the structured layer (19).
    Type: Application
    Filed: August 7, 2006
    Publication date: January 18, 2007
    Applicant: OC OERLIKON BALZERS AG
    Inventors: Heidi Thome-Forster, Claus Heine-Kempkens
  • Patent number: 7110181
    Abstract: This invention relates to a platform (11) and a method for generating electromagnetic field distributions. The invention relates in particular to optical sensors for measuring biological or chemical substances. The platform (11) according to the invention comprises a substrate (13), a structured layer (19) and, positioned between the substrate (13) and the structured layer (19), a multilayer assembly (17), said components being so matched relative to one another that upon appropriate impingement by electromagnetic radiation an electromagnetic field distribution is generated that is at a maximum within the structured layer (19).
    Type: Grant
    Filed: December 18, 2003
    Date of Patent: September 19, 2006
    Assignee: Unaxis Balzers Ltd.
    Inventors: Heidi Thomé-Förster, Claus Heine-Kempkens
  • Publication number: 20040247485
    Abstract: A sample substrate adapted for use with fluorescence excitation light with a first wavelength. A reflector is disposed on a base. The reflector includes a reflecting multilayer interference coating with at least two layers. Not all of the layers L fulfill a quarterwave condition: dL·nL=(2N+1)·1/4 wherein dL is a physical thickness of layer L, nL is an index of refraction of layer L at the first wavelength, N is an integer equal to or greater than zero and 1 is the first wavelength. Thicknesses of the layers ensure that any fluorescent sample material disposed on top of said multilayer interference coating would be located near an antinode of a standing wave formed by the excitation light with the first wavelength incident on said substrate.
    Type: Application
    Filed: June 2, 2004
    Publication date: December 9, 2004
    Inventors: Jorg Kraus, Johannes Edlinger, Max Wiki, Heidi Thome-Forster, Claus Heine-Kempkens, Bernd Maisenhoelder, Martin Kaspar
  • Publication number: 20040130787
    Abstract: This invention relates to a platform (11) and a method for generating electromagnetic field distributions. The invention relates in particular to optical sensors for measuring biological or chemical substances. The platform (11) according to the invention comprises a substrate (13), a structured layer (19) and, positioned between the substrate (13) and the structured layer (19), a multilayer assembly (17), said components being so matched relative to one another that upon appropriate impingement by electromagnetic radiation an electromagnetic field distribution is generated that is at a maximum within the structured layer (19).
    Type: Application
    Filed: December 18, 2003
    Publication date: July 8, 2004
    Inventors: Heidi Thome-Forster, Claus Heine-Kempkens