Patents by Inventor HEIICHIRO RYU

HEIICHIRO RYU has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20230384424
    Abstract: A light emitting device and a ranging system capable of moving an irradiation position of light The light emitting device includes a plurality of light emitting elements that generate light, and a moving unit to move an irradiation position of the light by driving a predetermined portion related to the light in a first direction. The light emitting elements are arranged at intersections of a plurality of first straight lines extending in a second direction orthogonal to the first direction and a plurality of second straight lines extending in a third direction parallel to neither the first direction nor the second direction. Light emitting elements on straight line A and the light emitting elements on adjacent straight line B are arranged so as not to be adjacent to each other in the first direction. The irradiation position of the light can be moved by, for example, uniaxial drive.
    Type: Application
    Filed: September 29, 2021
    Publication date: November 30, 2023
    Applicant: SONY SEMICONDUCTOR SOLUTIONS CORPORATION
    Inventors: Kohei IMAYOSHI, Katsuaki TATEBAYASHI, Takayuki KUNIMITSU, Katsuji KIMURA, Hiroyuki YAMANAKA, Heiichiro RYU, Jun KAWABATA
  • Patent number: 11215526
    Abstract: The present disclosure relates to an inspection apparatus and an inspection method that enable inspection of the performance of an image pickup element. Generation of collimated light and transmission of part of the collimated light through a transmission filter having a light-blocking face provided with circular holes arranged regularly, causes conversion to rays of columnar collimated light arranged regularly. An image including the rays of columnar collimated light arranged regularly, is captured by an image pickup element being inspected. Then, acquisition of the difference between the image captured by the image pickup element being inspected and an ideal image captured by an ideal image pickup element and comparison between the difference and a threshold, result in inspection of the performance of the image pickup element being inspected.
    Type: Grant
    Filed: September 20, 2018
    Date of Patent: January 4, 2022
    Assignee: SONY SEMICONDUCTOR SOLUTIONS CORPORATION
    Inventors: Katsuji Kimura, Hiroyuki Yamanaka, Yuji Furukawa, Kohei Harada, Hironori Takahashi, Hiroyuki Goto, Heiichiro Ryu, Katsuaki Tatebayashi
  • Publication number: 20200292414
    Abstract: The present disclosure relates to an inspection apparatus and an inspection method, and a program that enable inspection of the performance of an image pickup element. Generation of collimated light and transmission of part of the collimated light through a transmission filter having a light-blocking face provided with circular holes arranged regularly, causes conversion to rays of columnar collimated light arranged regularly. An image including the rays of columnar collimated light arranged regularly, is captured by an image pickup element being inspected. Then, acquisition of the difference between the image captured by the image pickup element being inspected and an ideal image captured by an ideal image pickup element and comparison between the difference and a threshold, result in inspection of the performance of the image pickup element being inspected The present disclosure can be applied to the manufacturing of an image pickup device.
    Type: Application
    Filed: September 20, 2018
    Publication date: September 17, 2020
    Inventors: KATSUJI KIMURA, HIROYUKI YAMANAKA, YUJI FURUKAWA, KOHEI HARADA, HIRONORI TAKAHASHI, HIROYUKI GOTO, HEIICHIRO RYU, KATSUAKI TATEBAYASHI