Patents by Inventor Heikki Johannes Sipilä

Heikki Johannes Sipilä has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Imaging X-ray detector based on direct conversion
    Patent number: 6933503
    Abstract: An X-ray detector (401, 501, 601) has a detecting element that comprises a semiconductor heterostructure where an undoped Germanium layer (402, 502) is enclosed between two oppositely doped Gallium Arsenide layers (403, 404, 503, 505).
    Type: Grant
    Filed: June 11, 2003
    Date of Patent: August 23, 2005
    Assignee: Oxford Instruments Analytical Oy
    Inventors: Heikki Johannes Sipilä, Jacques Bourgoin