Abstract: An X-ray fluorescence analyzer comprises an X-ray tube for emitting incident X-rays in the direction of a first optical axis. A slurry handling unit is configured to maintain a constant distance between a sample of slurry and the X-ray tube. A first crystal diffractor is located in a first direction from the slurry handling unit, and configured to separate a predefined first wavelength range from fluorescent X-rays that propagate into the first direction. It is configured to direct the fluorescent X-rays in the separated predefined first wavelength range to a first radiation detector. The input power rating of said X-ray tube is at least 400 watts. The first crystal diffractor comprises a pyrolytic graphite crystal. The optical path between said X-ray tube and the slurry handling unit is direct with no diffractor therebetween.

Abstract: An X-ray fluorescence analyzer system including an X-ray tube, a slurry handling unit, and a crystal diffractor located in a first direction from the slurry handling unit. The crystal diffractor separates a predefined wavelength range from fluorescent X-rays that propagate into the first direction, and directs the fluorescent X-rays in the separated predefined wavelength range to a radiation detector. The crystal diffractor includes a pyrolytic graphite crystal. The predefined wavelength range includes characteristic fluorescent radiation of a pre-defined element of interest with its atomic number Z between 41 and 60, the ends included. An energy resolution of the radiation detector is better than 600 eV at the energy of the characteristic fluorescent radiation.

Abstract: A method is for manufacturing a multilayer radiation window for an X-ray measurement apparatus. The method includes: producing a gas diffusion stop layer made of silicon nitride on a polished surface of a carrier; producing at least one combined layer on an opposite side of the gas diffusion stop layer than the carrier; attaching the combined structure including the carrier, the gas diffusion stop layer, the at least one combined layer to a region around an opening in a support structure with the at least one combined layer facing the support structure; and etching away the carrier. The at least one combined layer includes: a light attenuation layer made of aluminium, and a strengthening layer. A radiation window is manufactured with the method.

Abstract: An X-ray fluorescence analyzer includes an X-ray tube for emitting incident X-rays in the direction of a first optical axis. A slurry handling unit is configured to maintain a constant distance between a sample of slurry and the X-ray tube. A first crystal diffractor is located in a first direction from the slurry handling unit and configured to separate a predefined first wavelength range from fluorescent X-rays that propagate into the first direction. The first crystal diffractor is configured to direct the fluorescent X-rays in the separated predefined first wavelength range to a first radiation detector. The first crystal diffractor includes a pyrolytic graphite crystal that has a diffractive surface, which is a simply connected surface. The first radiation detector is a solid-state semiconductor detector.

Abstract: An X-ray fluorescence analyzer including an X-ray tube for emitting incident X-rays in the direction of a first optical axis. A slurry handling unit is configured to maintain a constant distance between a sample of slurry and the X-ray tube. A first crystal diffractor is located in a first direction from the slurry handling unit. The first crystal diffractor includes a first crystal and a first radiation detector configured to detect fluorescent X-rays diffracted by the first crystal at a first energy resolution. A second crystal diffractor is located in a second direction from the slurry handling unit. The second crystal diffractor includes a second crystal and a second radiation detector configured to detect fluorescent X-rays diffracted by the second crystal at a second energy resolution.

Abstract: An X-ray fluorescence analyzer system including an X-ray tube, a slurry handling unit, and a crystal diffractor located in a first direction from the slurry handling unit. The crystal diffractor separates a predefined wavelength range from fluorescent X-rays that propagate into the first direction, and directs the fluorescent X-rays in the separated predefined wavelength range to a radiation detector. The crystal diffractor includes a pyrolytic graphite crystal. The predefined wavelength range includes characteristic fluorescent radiation of a pre-defined element of interest with its atomic number Z between 41 and 60, the ends included. An energy resolution of the radiation detector is better than 600 eV at the energy of the characteristic fluorescent radiation.

Abstract: An X-ray fluorescence analyzer includes an X-ray tube for emitting incident X-rays in the direction of a first optical axis. A slurry handling unit is configured to maintain a constant distance between a sample of slurry and the X-ray tube. A first crystal diffractor is located in a first direction from the slurry handling unit and configured to separate a predefined first wavelength range from fluorescent X-rays that propagate into the first direction. The first crystal diffractor is configured to direct the fluorescent X-rays in the separated predefined first wavelength range to a first radiation detector. The first crystal diffractor includes a pyrolytic graphite crystal that has a diffractive surface, which is a simply connected surface. The first radiation detector is a solid-state semiconductor detector.

Abstract: An X-ray fluorescence analyzer including an X-ray tube for emitting incident X-rays in the direction of a first optical axis. A slurry handling unit is configured to maintain a constant distance between a sample of slurry and the X-ray tube. A first crystal diffractor is located in a first direction from the slurry handling unit. The first crystal diffractor includes a first crystal and a first radiation detector configured to detect fluorescent X-rays diffracted by the first crystal at a first energy resolution. A second crystal diffractor is located in a second direction from the slurry handling unit. The second crystal diffractor includes a second crystal and a second radiation detector configured to detect fluorescent X-rays diffracted by the second crystal at a second energy resolution.

Abstract: An X-ray fluorescence analyzer comprises an X-ray tube for emitting incident X-rays in the direction of a first optical axis. A slurry handling unit is configured to maintain a constant distance between a sample of slurry and the X-ray tube. A first crystal diffractor is located in a first direction from the slurry handling unit, and configured to separate a predefined first wavelength range from fluorescent X-rays that propagate into the first direction. It is configured to direct the fluorescent X-rays in the separated predefined first wavelength range to a first radiation detector. The input power rating of said X-ray tube is at least 400 watts. The first crystal diffractor comprises a pyrolytic graphite crystal. The optical path between said X-ray tube and the slurry handling unit is direct with no diffractor therebetween.

Abstract: The invention relates to a method for manufacturing a multilayer radiation window for an X-ray measurement apparatus. The method comprises: producing a gas diffusion stop layer made of silicon nitride on a polished surface of a carrier; producing at least one combined layer on an opposite side of said gas diffusion stop layer than said carrier; attaching the combined structure comprising said carrier, said gas diffusion stop layer, said at least one combined layer to a region around an opening in a support structure with the at least one combined layer facing said support structure; and etching away said carrier. The at least one combined layer comprises: a light attenuation layer made of aluminium, and a strengthening layer. The invention relates also a radiation window manufactured with the method.

Abstract: A radiation window foil is provided for an X-ray radiation window. It includes a continuous window layer with a first side and a second side. A first mesh or grid layer is stacked on or bonded to the first side of the continuous window layer. A second mesh or grid layer is stacked on or bonded to the second side of the continuous window layer.

Abstract: A radiation window foil is provided for an X-ray radiation window. It includes a continuous window layer with a first side and a second side. A first mesh or grid layer is stacked on or bonded to the first side of the continuous window layer. A second mesh or grid layer is stacked on or bonded to the second side of the continuous window layer.

Abstract: A collimator for collimating X-rays in an X-ray spectrometric measuring apparatus comprises a body of a microchannel plate (203, 205, 701, 702, 703, 704, 705, 711, 712, 713, 714, 715, 801, 901, 1003). Most advantageously the channel walls of the microchannel plate are plated with a thin coating (310) of a heavy metal.

Abstract: A measurement apparatus and method are provided for determining the material composition of a sample. An X-ray fluorescence detector (412) detects fluorescent X-rays coming from said sample under irradiation with incident X-rays. A laser source (301) is adapted to produce a laser beam. Focusing optics (302) focus said laser beam into a focal spot on a surface of said sample. An optical sensor (312) detects optical emissions coming from particles of said sample upon being exposed to said laser beam at said focal spot. A gas administration subsystem (104, 105, 106, 107, 108) is adapted to controllably deliver gas to a space (101) around said focal spot.

Abstract: A drift detector produces an indication of an occurred hit of a quantum in the detector element. For neutralising accumulated charge in the detector element, indications of occurred hits are used to trigger pulses of deliberately increased neutralisation current into the drift detector for the duration of a limited time interval. Alternatively such triggering may be based on the operation of a timer.

Abstract: A portable measurement apparatus is presented for inducing and measuring fluorescent X-ray radiation. It comprises an X-ray source (303, 902, 1005, 1105) adapted to controllably irradiate a sample (301, 803) with X-rays, and a detector (305, 406, 1006, 1106) adapted to detect fluorescent radiation emitted by said sample (301, 803). The X-ray source (303, 902, 1005, 1105) is an X-ray tube, an anode of which comprises at least one of silver, rhodium and molybdenium. Consequently said X-ray tube is adapted to controllably emit L-line radiation of at least one of silver, rhodium and molybdenium.

Abstract: The invention relates to detection performed over millimeter and submillimeter wavelengths, especially to imaging solutions functioning over a submillimeter-wavelength range. The system of the invention uses detectors, comprising antenna coupled bolometers together with wavelength selective optics. The detector matrix is preferably curved for reducing the number of imaging errors. In order to provide a curved detector matrix, the detector matrix is constituted by flat submatrices, each being provided with one or more integrated antenna coupled bolometers. The detectable frequency range is preferably limited in two stages, first by means of wavelength selective optics and secondly by means of the operating band of the antenna of an antenna coupled bolometer. In order to focus the incoming radiation on bolometers, the bolometer substrate is fitted or the surface or interior of the bolometer substrate is provided with a bolometer lens or a corresponding optical element in alignment with each bolometer.

Abstract: The invention relates to X-ray fluorescence measuring systems, more specifically to methods for producing polarized X-radiation. The invention is based on the idea of using beryllium as the anode material despite its poor effectiveness. Some of the X-radiation spectrum produced by a beryllium anode is polarized radiation, more specifically its high-energy portion. The system of the invention involves filtering out the low-energy portion of the spectrum, whereby the remaining intensely polarized radiation can be used as excitation radiation in X-ray fluorescence measurements. The system of the invention is capable of achieving a certain intensity of polarized X-radiation by means of an X-ray tube less powerful than those used in common prior art solutions based on the use of scattering media.

Abstract: The invention relates to a method and apparatus for providing cooling in a reloadable cooling apparatus, which can be used in actuators requiring low temperatures. According to the invention, the loading of at least one cooling element (2, 22, 32), located in the vacuum of the cooling apparatus, is carried out through at least one cooling surface (4, 25, 34), connected to outside the cooling apparatus (1, 21, 31), and the period between two loadings is extended by reducing the transversal area of the supporting member (3, 23, 33) and by reducing the heat conduction distance of the supporting member (3, 23, 33) of the cooling element from the cooling apparatus (1, 21, 33), advantageously by shaping the supporting member (3, 23, 33).

Abstract: The invention relates to a method for preventing leaks in a propeller shaft bearing arrangement including a plain bearing (2), which is lubricated with oil or water and which supports the propeller shaft (1) extending through an opening in the body (4) of a hull, and packing members (6,7) for keeping the lubricant in the lubrication space and for preventing water from entering the bearing arrangement. According to the invention, the pressure vibrations occuring in the lubricant are equalized arranging, in the lubrication space, a medium possessing a high compressibility, which medium by means of changes in volume receives and equalizes said pressure vibrations.