Patents by Inventor Heiko Backer

Heiko Backer has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9349645
    Abstract: An apparatus, device and method for wafer dicing is disclosed. In one example, the apparatus discloses: a wafer holding device having a first temperature; a die separation bar moveably coupled to the wafer holding device; and a cooling device coupled to the apparatus and having a second temperature which enables the die separation bar to fracture an attachment material in response to movement with respect to the wafer holding device. In another example, the method discloses: receiving a wafer having an attachment material applied to one side of the wafer; placing the wafer in a holding device having a first temperature; urging a die separation bar toward the wafer; and cooling the attachment material to a second temperature, which is lower than the first temperature, until the attachment material fractures in response to the urging.
    Type: Grant
    Filed: October 16, 2013
    Date of Patent: May 24, 2016
    Assignee: NXP B.V.
    Inventors: Martin Lapke, Hartmut Buenning, Sascha Moeller, Guido Albermann, Thomas Rohleder, Heiko Backer
  • Publication number: 20150104931
    Abstract: An apparatus, device and method for wafer dicing is disclosed. In one example, the apparatus discloses: a wafer holding device having a first temperature; a die separation bar moveably coupled to the wafer holding device; and a cooling device coupled to the apparatus and having a second temperature which enables the die separation bar to fracture an attachment material in response to movement with respect to the wafer holding device. In another example, the method discloses: receiving a wafer having an attachment material applied to one side of the wafer; placing the wafer in a holding device having a first temperature; urging a die separation bar toward the wafer; and cooling the attachment material to a second temperature, which is lower than the first temperature, until the attachment material fractures in response to the urging.
    Type: Application
    Filed: October 16, 2013
    Publication date: April 16, 2015
    Applicant: NXP B.V.
    Inventors: Martin Lapke, Hartmut Buenning, Sascha Moeller, Guido Albermann, Thomas Rohleder, Heiko Backer
  • Patent number: 5878941
    Abstract: The invention relates to a method of soldering components on a carrier foil whereby hot gas is conducted onto the lower side of the carrier foil. Special soldering methods are necessary especially in SMD technology, whereby components can be soldered in large numbers on a carrier foil in a non-destructive manner both for the component itself and for the carrier foil. According to the invention, the hot gas is aimed at a soldering spot through a nozzle, heating this spot until solder heated by the hot gas flow melts on the surface of the carrier foil.
    Type: Grant
    Filed: July 25, 1996
    Date of Patent: March 9, 1999
    Assignee: U.S. Philips Corporation
    Inventors: Heiko Backer, Reinhard Wendt