Patents by Inventor Heiko Haschke

Heiko Haschke has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Probe mounting device for a scanning probe microscope
    Patent number: 7114405
    Abstract: The invention relates to a probe (207) mounting device for a scanning probe microscope, especially a scanning force microscope, comprising a retaining member (200) for installation in a measuring assembly of a scanning probe microscope. The probe (207) is detachably mounted on the retaining member (200) by means of a clamping member (201), the clamping member being secured in self-locking fashion to the retaining member (200).
    Type: Grant
    Filed: September 24, 2002
    Date of Patent: October 3, 2006
    Assignee: JPK Instruments AG
    Inventors: Olaf Sünwoldt, Heiko Haschke
  • Device for fixing a measuring probe for a raster scanning probe microscope
    Publication number: 20050017150
    Abstract: A probe mounting device for a scanning probe microscope The invention relates to a probe (207) mounting device for a scanning probe microscope, especially a scanning force microscope, comprising a retaining member (200) for installation in a measuring assembly of a scanning probe microscope. The probe (207) is detachably mounted on the retaining member (200) by means of a clamping member (201), the clamping member being secured in self-locking fashion to the retaining member (200).
    Type: Application
    Filed: September 24, 2002
    Publication date: January 27, 2005
    Inventors: Olaf Sunwoldt, Heiko Haschke