Patents by Inventor Heiko Knopf

Heiko Knopf has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10782451
    Abstract: A method for producing a reflection-reducing layer system is disclosed. In an embodiment, a method includes depositing an organic layer on the substrate, generating a nanostructure in the organic layer by a plasma etching process, applying a cover layer to the nanostructure, wherein the organic layer, the nanostructure and the cover layer together form a reflection-reducing structure, wherein the cover layer comprises an inorganic material or an organosilicon compound, and wherein the cover layer is at least 5 nm thick and performing a post-treatment after applying the cover layer, wherein a material of the organic layer is at least partially removed, decomposed or chemically converted, and wherein an effective refractive index neff,2 of the reflection-reducing structure after the post-treatment is smaller than an effective refractive index neff,1 of the reflection-reducing structure before the post-treatment.
    Type: Grant
    Filed: December 20, 2017
    Date of Patent: September 22, 2020
    Assignee: FRAUNHOFER-GESELLSCHAFT ZUR FÖRDERUNG DER ANGEWANDTEN FORSCHUNG E.V.
    Inventors: Ulrike Schulz, Peter Munzert, Sabrina Wolleb, Friedrich Rickelt, Heiko Knopf
  • Publication number: 20200081160
    Abstract: A method for producing a reflection-reducing layer system is disclosed. In an embodiment, a method includes depositing an organic layer on the substrate, generating a nanostructure in the organic layer by a plasma etching process, applying a cover layer to the nanostructure, wherein the organic layer, the nanostructure and the cover layer together form a reflection-reducing structure, wherein the cover layer comprises an inorganic material or an organosilicon compound, and wherein the cover layer is at least 5 nm thick and performing a post-treatment after applying the cover layer, wherein a material of the organic layer is at least partially removed, decomposed or chemically converted, and wherein an effective refractive index neff,2 of the reflection-reducing structure after the post-treatment is smaller than an effective refractive index neff,1 of the reflection-reducing structure before the post-treatment.
    Type: Application
    Filed: December 20, 2017
    Publication date: March 12, 2020
    Inventors: Ulrike Schulz, Peter Munzert, Sabrina Wolleb, Friedrich Rickelt, Heiko Knopf
  • Patent number: 10539716
    Abstract: A reflection-reducing layer system is disclosed. In an embodiment, the system includes a refractive index gradient layer including an inorganic material and an organic material in a spatially varying composition, wherein the refractive index gradient layer has a refractive index which decreases in a growth direction and an organic layer arranged above the refractive index gradient layer, the organic layer having a surface including a nanostructure.
    Type: Grant
    Filed: March 14, 2018
    Date of Patent: January 21, 2020
    Assignee: FRAUNHOFER-GESELLSCHAFT ZUR FOERDERUNG DER ANGEWANDTEN FORSCHUNG E.V.
    Inventors: Ulrike Schulz, Friedrich Rickelt, Peter Munzert, Hanno Heiße, Heiko Knopf, Kevin Füchsel, Norbert Kaiser
  • Publication number: 20180203162
    Abstract: A reflection-reducing layer system is disclosed. In an embodiment, the system includes a refractive index gradient layer including an inorganic material and an organic material in a spatially varying composition, wherein the refractive index gradient layer has a refractive index which decreases in a growth direction and an organic layer arranged above the refractive index gradient layer, the organic layer having a surface including a nanostructure.
    Type: Application
    Filed: March 14, 2018
    Publication date: July 19, 2018
    Inventors: Ulrike Schulz, Friedrich Rickelt, Peter Munzert, Hanno Heiße, Heiko Knopf, Kevin Füchsel, Norbert Kaiser
  • Patent number: 9939556
    Abstract: A method for producing a reflection-reducing layer system on a substrate and a reflection-reducing layer system are disclosed. According to an embodiment the method includes depositing a refractive index gradient layer on the substrate by co-evaporation of an inorganic material and an organic material, wherein the refractive index gradient layer has a refractive index which decreases in a growth direction, depositing an organic layer above the refractive index gradient layer, and producing a nanostructure in the organic layer by a plasma etching process.
    Type: Grant
    Filed: January 27, 2016
    Date of Patent: April 10, 2018
    Assignee: Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V.
    Inventors: Ulrike Schulz, Friedrich Rickelt, Peter Munzert, Hanno Heiβe, Heiko Knopf, Kevin Füchsel, Norbert Kaiser
  • Publication number: 20160216409
    Abstract: A method for producing a reflection-reducing layer system on a substrate and a reflection-reducing layer system are disclosed. According to an embodiment the method includes depositing a refractive index gradient layer on the substrate by co-evaporation of an inorganic material and an organic material, wherein the refractive index gradient layer has a refractive index which decreases in a growth direction, depositing an organic layer above the refractive index gradient layer, and producing a nanostructure in the organic layer by a plasma etching process.
    Type: Application
    Filed: January 27, 2016
    Publication date: July 28, 2016
    Inventors: Ulrike Schulz, Friedrich Rickelt, Peter Munzert, Hanno Heiße, Heiko Knopf, Kevin Füchsel, Norbert Kaiser