Patents by Inventor Heiko Schmitt

Heiko Schmitt has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240108490
    Abstract: An ankle/foot orthosis with a foot part, which has a sole for receiving a foot, and with a shin part which, when fitted in place, bears on the frontal aspect of a shin and is connected to the foot part via a medially extending spring, wherein the spring, behind an ankle area, forms a hinge area that allows a movement of the shin part relative to the foot part in the anterior-posterior direction.
    Type: Application
    Filed: December 14, 2023
    Publication date: April 4, 2024
    Inventors: Jan JOHNSSON, Gordon SIEWERT, Heiko DREWITZ, Olaf KROLL-ORYWAHL, Maximilian SEGL, Marcus LURSSEN, Markus TUTTEMANN, Boris LJUBIMIR, Norbert SCHIMEK, Wolfgang KEINER, Alexander SCHMITT
  • Patent number: 8841084
    Abstract: Disclosed herein are methods of detecting and/or prognosing myocardial infarction by detecting a proteolytic fragment of caspase-3 such as the p17 fragment or the p12 fragment. The myocardial infarction can be STEMI or NSTEMI.
    Type: Grant
    Filed: May 12, 2011
    Date of Patent: September 23, 2014
    Assignees: The University of Connecticut, Mayo Foundation for Medical Education and Research
    Inventors: Bruce T. Liang, Heiko Schmitt, Michael Azrin, Christopher C. Pickett, Allan S. Jaffe
  • Publication number: 20130143232
    Abstract: Disclosed herein are methods of detecting and/or prognosing myocardial infarction by detecting a proteolytic fragment of caspase-3 such as the p17 fragment or the p12 fragment. The myocardial infarction can be STEMI or NSTEMI.
    Type: Application
    Filed: May 12, 2011
    Publication date: June 6, 2013
    Applicants: MAYO FOUNDATION FOR MEDICAL EDUCATION AND RESEARCH, UNIVERSITY OF CONNECTICUT
    Inventors: Bruce T. Liang, Heiko Schmitt, Michael Azrin, Christopher C. Pickett, Allan S. Jaffe
  • Patent number: 7495591
    Abstract: Testing a device under test—DUT—includes providing a test signal from the DUT to a test probe, taking from the test signal being present at the test probe analog samples at a first sampling rate, taking from the test signal being present at the test probe digital samples at a second sampling rate, providing a control signal indicative of sampling times of the analog samples, and performing an analysis of the digital samples in conjunction with the control signal.
    Type: Grant
    Filed: May 31, 2007
    Date of Patent: February 24, 2009
    Assignee: Agilent Technologies, Inc.
    Inventors: Joachim Moll, Heiko Schmitt, Michael Fleischer-Reumann
  • Publication number: 20080001798
    Abstract: Testing a device under test—DUT—includes providing a test signal from the DUT to a test probe, taking from the test signal being present at the test probe analog samples at a first sampling rate, taking from the test signal being present at the test probe digital samples at a second sampling rate, providing a control signal indicative of sampling times of the analog samples, and performing an analysis of the digital samples in conjunction with the control signal.
    Type: Application
    Filed: May 31, 2007
    Publication date: January 3, 2008
    Inventors: Joachim Moll, Heiko Schmitt, Michael Fleischer-Reumann