Abstract: A modular device for a fixed arrangement and interconnection of individual separation units and/or first functional units for performing one or more unit operations in a biotechnological process. The modular device includes a plurality of distributor caps provided for attachment to the separation units and/or first functional units. The distributor caps each have: a fluid distribution mechanism having a working connection and at least two supply or discharge connections, wherein the fluid distribution mechanism can assume at least two defined switching positions; connection mechanisms for establishing a flow communication between a fluid inlet or outlet of the separation unit or the first functional unit and the working connection of the fluid distribution mechanism; coupling mechanisms for establishing a rigid mechanical coupling and a flow communication with an adjacent distributor cap; and an interface for changing the switching positions of the fluid distribution mechanism.

Abstract: A distributor assembly, which is provided in particular for a separation unit of a modular process device arrangement, including a fluid distributor device having a plurality of fluid ports, wherein the fluid distributor device can selectively establish and block fluid communications between the fluid ports. The distributor assembly further includes a connecting element and a retaining element. The connecting element is adapted to be attached to one of the fluid ports, and the distributor assembly includes an associated mounting slot at the fluid port. The mounting slot is adapted to the shape of the retaining element such that the retaining element can be inserted into the mounting slot up to a defined retaining position, in which the retaining element engages the connecting element and fixes it in place.

Abstract: An alignment marker unit for an object holder for microscopic imaging of an object with a microscope, wherein the alignment marker unit can be removed from and remounted on the object holder, wherein the alignment marker unit has at least one alignment marker for microscope-supported detection, and wherein the alignment marker is designed to determine a coordinate system for the object holder which allows for the microscope-supported calibration of the object or an area of the object relative to its position to the object holder and the position of the object holder relative to the microscope. Furthermore, an object holder system including an object holder and an alignment marker unit as described above is provided.

Abstract: A filter holder for correlative particle analysis during imaging microscopy methods or methods of the elemental analysis including a receiving element with a filter support and a fastening unit. The plane filter support is designed as pressure piece and is movably arranged in the receiving element to be movable at a right angle to the surface of the filter for the purpose of tensioning the filter. The fastening unit includes a clamping element which encloses the filter at the circumference of the filter and is held by a tensioning element which is supported in the receiving element.

Abstract: The invention relates to a pivot arm stand for digital microscopes having a pivot arm which is pivotable about a rotation axis. According to the invention the pivotal movement may be blocked by a high torque magnetic brake arranged about a rotation axis (DA), which consists of a simultaneously pivoting part (MS) and a fixed part (ML), whereby the blocking may be suspended for the duration of a touch of a button (TS) by releasing the high torque magnetic brake, the button (TS) being arranged on the pivot arm (SA) in such a way that it can be conveniently pressed with at least one finger of the same hand which clasps an ergonomically shaped section (EB) of the pivot arm (SA), which is provided for grasping the pivot arm (SA) for setting a pivot angle (w).

Abstract: The invention relates to an optical assembly for spectral filtration of light, having a plurality of filters which are permeable to light of different spectral ranges, a filter selection mirror which can be moved for selectable deflection of light to different optical paths to the different filters, and an output mirror which can be moved to guide light coming from one of the filters to an optical path which is the same for all the filters. The optical assembly is characterized according to the invention in that in each case at least one stationary deflection optical system is provided for each of the optical paths to the different filters to guide light from the filter selection mirror to the respective filter and/or light from the respective filter to the output mirror, and the stationary deflection optical systems are arranged so that optical path lengths on the different optical paths from the filter selection mirror to the output mirror are equal.

Abstract: An alignment marker unit for an object holder for microscopic imaging of an object with a microscope, wherein the alignment marker unit can be removed from and remounted on the object holder, wherein the alignment marker unit has at least one alignment marker for microscope-supported detection, and wherein the alignment marker is designed to determine a coordinate system for the object holder which allows for the microscope-supported calibration of the object or an area of the object relative to its position to the object holder and the position of the object holder relative to the microscope. Furthermore, an object holder system including an object holder and an alignment marker unit as described above is provided.

Abstract: For the microscopy of an object or a specimen with a combination of optical microscopy and particle beam microscopy, an electrically conducting specimen carrier (1) is used which is configured for use in a particle beam microscope as well as in an optical microscope and has at least one alignment mark (2). The alignment mark is configured as a pass-through structure and is detectable from the top and from the bottom of the specimen carrier.

Abstract: For the microscopy of an object or a specimen with a combination of optical microscopy and particle beam microscopy, an electrically conducting specimen carrier (1) is used which is configured for use in a particle beam microscope as well as in an optical microscope and has at least one alignment mark (2). The alignment mark is configured as a pass-through structure and is detectable from the top and from the bottom of the specimen carrier.

Abstract: A condenser arrangement for brightfield illumination and/or darkfield illumination for optical microscopes comprises in a housing basic optics having at least one lens, at least one front optics which can be inserted into the illumination beam path in front of the basic optics, and means for inserting the front optics into the illumination beam path of the microscope. A first swiveling arm and a second swiveling arm are swivelably arranged at the housing of the condenser. The first swiveling arm carries first front optics with a high aperture for brightfield illumination and the second swiveling arm carries second front optics for darkfield illumination. The two swiveling arms are arranged at a defined distance from the shared basic optics of the condenser in direction of the optical axis of the illumination beam path. An aperture iris diaphragm is provided on the object side in front of the basic optics and is opened when the cardioid optics are inserted.

Abstract: The invention is directed to a darkfield illumination system and is applicable in transmitted light microscopy and in incident light microscopy. A combination with a first, segmented mirror and a second, aspherical mirror is proposed for the purpose of uniform illumination of the large object fields occurring at low magnifications.

Abstract: A condenser arrangement for brightfield illumination and/or darkfield illumination for optical microscopes comprises in a housing basic optics having at least one lens, at least one front optics which can be inserted into the illumination beam path in front of the basic optics, and means for inserting the front optics into the illumination beam path of the microscope. A first swiveling arm and a second swiveling arm are swivelably arranged at the housing of the condenser. The first swiveling arm carries first front optics with a high aperture for brightfield illumination and the second swiveling arm carries second front optics for darkfield illumination. The two swiveling arms are arranged at a defined distance from the shared basic optics of the condenser in direction of the optical axis of the illumination beam path. An aperture iris diaphragm is provided on the object side in front of the basic optics and is opened when the cardioid optics are inserted.