Abstract: Size-reduction machines, feed units, and methods capable of producing reduced-size products from a variety of solid and semisolid materials. Such machines have an impeller that rotates on an approximately horizontal axis and an opening at an axial end of the impeller. A feed unit includes a feed hopper for feeding products to an interior of the impeller through the opening of the machine, and a slicing knife is mounted to the impeller and radially protrudes across the opening of the machine to slice products into segments as they enter the interior of the impeller.

Abstract: Size-reduction machines, feed units, and methods capable of producing reduced-size products from a variety of solid and semisolid materials. Such machines have an impeller that rotates on an approximately horizontal axis and an opening at an axial end of the impeller. A feed unit includes a feed hopper for feeding products to an interior of the impeller through the opening of the machine, and a slicing knife is mounted to the impeller and radially protrudes across the opening of the machine to slice products into segments as they enter the interior of the impeller.

Abstract: A device for inspecting a substrate having at least one printed-on layer, including a guide carrier on which the substrate is supported. An inspection head is movable in at least two directions relative to the guide carrier and is provided with an illumination mechanism and an detection device for detecting electromagnetic radiation reflected from the substrate and conveying it to an evaluation device for detecting substrate errors. The detection device has a digital camera with optics for detecting a definition of less than 200 microns. A movement mechanism controls the relative movement between guide carrier and inspection head during an image-taking cycle during which sequential or overlapping individual images can be joined together to form an overall image of the substrate.

Abstract: A device for inspecting a substrate having at least one printed-on layer, including a guide carrier on which the substrate is supported. An inspection head is movable in at least two directions relative to the guide carrier and is provided with an illumination mechanism and an detection device for detecting electromagnetic radiation reflected from the substrate and conveying it to an evaluation device for detecting substrate errors. The detection device has a digital camera with optics for detecting a definition of less than 200 microns. A movement mechanism controls the relative movement between guide carrier and inspection head during an image-taking cycle during which sequential or overlapping individual images can be joined together to form an overall image of the substrate.

Abstract: The optical element provides for the displacement of two end sections having slanted end faces. The slanted end faces have such an angle to the optical axis of the fiber, that the limit angle for total reflection is exceeded. The displacement remains substantially below the diameter of the fiber.