Patents by Inventor Heinrich Ulrich

Heinrich Ulrich has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20230203492
    Abstract: Disclosed herein are embodiments of a compound useful for treating or preventing betacoronavirus infections such as SARS-Cov-2 infections. Also disclosed is a method for administering the compound to a subject, particularly a human subject, to treat or prevent a betacoronavirus infection in the subject. The compound can comprise an oligomer comprising a nucleic acid base sequence that is antisense to at least a portion of a SARS-CoV-2 genomic RNA, and can comprise a sequence present in the 5? UTR and first 20 nt of coding sequence of the SARS-CoV-2 genomic RNA. The compound also can contain a peptide sequence. In some embodiments, the compound is a peptide-conjugated phosphorodiamidate morpholino oligomer (PPMO).
    Type: Application
    Filed: November 7, 2022
    Publication date: June 29, 2023
    Applicants: Oregon State University, The U.S.A., as Represented by the Secretary, Department of Health and Human Services
    Inventors: Hong M. Moulton, David Adam Stein, Heinrich Ulrich Feldmann, Kyle Ture Rosenke
  • Patent number: 8817368
    Abstract: A light source and/or a deflector and/or the emitting end of an illuminating optical fiber is arranged in the rear focal plane of a lens for total internal reflection microscopy.
    Type: Grant
    Filed: May 1, 2006
    Date of Patent: August 26, 2014
    Assignee: Leica Microsystems CMS GmbH
    Inventors: Heinrich Ulrich, Werner Knebel, Kyra Moellmann
  • Patent number: 8587865
    Abstract: A device for examining and manipulating microscopic objects with a microscope having a light source that serves to illuminate the object, and which generates an illumination light beam that runs along and illumination beam path, that can be guided over or through the object by means of a beam deflector, with a detector to detect light emitted from the object that runs along the detection beam path, with a primary beam splitter, and with a light source, which generates a manipulation light beam that runs along an illumination beam path, that serves to manipulate the object.
    Type: Grant
    Filed: November 3, 2005
    Date of Patent: November 19, 2013
    Assignee: Leica Microsystems CMS GmbH
    Inventors: Juergen Riedmann, Ingo Boehm, Volker Leimbach, Heinrich Ulrich, Holger Birk
  • Patent number: 8472113
    Abstract: A scanning microscope includes a light source, illumination optics, and a scanning device for moving the illumination focus across a target region and doing so by varying the direction of incidence in which the illuminating beam enters an entrance pupil of the illumination optics. To incline the illumination focus relative to the optical axis of the optics, the scanning device directs the illuminating beam onto a portion of the entrance pupil that is offset from the center of the pupil and, in order to move the illumination focus across the target region, the scanning device varies the direction of incidence of the illuminating beam within said portion. An observation objective is provided which is spatially separated from the illumination optics and disposed such that its optical axis (O3) is substantially perpendicular to the target region and at an acute angle (?) to the optical axis (O1) of the illumination optics.
    Type: Grant
    Filed: June 13, 2012
    Date of Patent: June 25, 2013
    Assignee: Leica Microsystems CMS GmbH
    Inventors: Werner Knebel, Heinrich Ulrich
  • Publication number: 20120320438
    Abstract: A scanning microscope includes a light source, illumination optics, and a scanning device for moving the illumination focus across a target region and doing so by varying the direction of incidence in which the illuminating beam enters an entrance pupil of the illumination optics. To incline the illumination focus relative to the optical axis of the optics, the scanning device directs the illuminating beam onto a portion of the entrance pupil that is offset from the center of the pupil and, in order to move the illumination focus across the target region, the scanning device varies the direction of incidence of the illuminating beam within said portion. An observation objective is provided which is spatially separated from the illumination optics and disposed such that its optical axis (O3) is substantially perpendicular to the target region and at an acute angle (?) to the optical axis (O1) of the illumination optics.
    Type: Application
    Filed: June 13, 2012
    Publication date: December 20, 2012
    Applicant: LEICA MICROSYSTEMS CMS GMBH
    Inventors: Werner KNEBEL, Heinrich ULRICH
  • Publication number: 20110222147
    Abstract: An apparatus in a simultaneous fluorescence excitation microscope is described, allowing simultaneous fluorescence excitation by light of at least two different wavelengths. The apparatus has a laser light source generating a light beam. A first beam splitter splits the light beam into a first partial light beam and a second partial light beam. A wavelength converter converts the wavelength of the first partial light beam. A microscope optical system into which the first partial light beam and the second partial light beam are coupled directs the two partial light beams onto an object to be examined.
    Type: Application
    Filed: March 15, 2011
    Publication date: September 15, 2011
    Applicant: LEICA MICROSYSTEMS CMS GMBH
    Inventors: Heinrich Ulrich, Volker Leimbach
  • Patent number: 7808699
    Abstract: A microscope objective includes an optical fiber. The optical fiber can deliver light for total internal reflection microscopy. The optical fiber can couple illumination light directly into the microscope objective through the optical fiber.
    Type: Grant
    Filed: September 23, 2004
    Date of Patent: October 5, 2010
    Assignee: Leica Microsystems CMS GmbH
    Inventors: Heinrich Ulrich, Werner Knebel, Kyra Moellmann
  • Patent number: 7746552
    Abstract: A microscope with a light source that produces an illumination light beam for evanescently illuminating a sample includes an adjustment mechanism with which the polarization of the illumination light beam may be changed.
    Type: Grant
    Filed: May 4, 2009
    Date of Patent: June 29, 2010
    Assignee: Leica Microsystems CMS GmbH
    Inventors: Andreas Hecker, Werner Knebel, Kyra Moellmann, Heinrich Ulrich
  • Patent number: 7660035
    Abstract: A scanning microscope includes at least one light source, an acousto-optical element, a beam deflection device and a beam guiding device. The at least one light source generates an illuminating light beam. The acousto-optical element spatially splits a sub-light beam from the illuminating light beam and adjusts an optical power of the illuminating light beam. The beam deflection device scans the illuminating light beam over or through a sample. The beam guiding device directs the sub-light beam onto the sample.
    Type: Grant
    Filed: October 13, 2004
    Date of Patent: February 9, 2010
    Assignee: Leica Microsystems CMS GmbH
    Inventors: Ingo Böhm, Heinrich Ulrich, Werner Knebel
  • Patent number: 7633622
    Abstract: A microscope with evanescent sample illumination and a method for testing samples are disclosed. A first evanescent field, which exhibits a first penetration depth in the sample, and a second evanescent field, which exhibits a second penetration depth in the sample that is greater than the first penetration depth, are produced. A detector is provided that detects the first detection light, which exits from the part of the sample illuminated with the first evanescent field, and which produces first detection light data therefrom, and the second detection light, which exits from the part of the sample illuminated with the second evanescent field, and which produces second detection light data therefrom. Furthermore, a processing module is provided for processing the first and second detection light data.
    Type: Grant
    Filed: May 1, 2006
    Date of Patent: December 15, 2009
    Assignee: Leica Microsystems CMS GmbH
    Inventors: Andreas Hecker, Heinrich Ulrich, Werner Knebel, Kyra Moellmann
  • Publication number: 20090213456
    Abstract: A microscope with a light source that produces an illumination light beam for evanescently illuminating a sample includes an adjustment mechanism with which the polarization of the illumination light beam may be changed.
    Type: Application
    Filed: May 4, 2009
    Publication date: August 27, 2009
    Applicant: LEICA MICROSYSTEMS CMS GMBH
    Inventors: Andreas Hecker, Werner Knebel, Kyra Moellmann, Heinrich Ulrich
  • Patent number: 7564624
    Abstract: The invention relates to a microscope comprising at least one first and second light sources, a first light-guiding fiber connected to the first light source and a second light-guiding fiber connected to the second light source, wherein the light emitted by corresponding light source is injectable into the connected light-guiding fiber. The inventive microscope also comprises an objective lens disposed in the illumination beam path and is characterized in that a fiber multiplexer connected to the first and second light-guiding fibers, receiving the light from the light source and selectively allowing the light from the first or second light source to pass is disposed in the illumination beam path.
    Type: Grant
    Filed: June 22, 2005
    Date of Patent: July 21, 2009
    Assignee: Leica Microsystems CMS GmbH
    Inventors: Volker Leimbach, Heinrich Ulrich
  • Patent number: 7554726
    Abstract: A microscope comprises an objective and a light source that produces an illumination light beam—in particular for evanescent illumination of a sample, which exhibits a focus in the plane of the objective pupil. To adjust the penetration depth, an adjustment mechanism is provided with which the spatial position of the focus within the plane of the objective pupil may be changed.
    Type: Grant
    Filed: May 1, 2006
    Date of Patent: June 30, 2009
    Assignee: Leica Microsystems CMS GmbH
    Inventors: Heinrich Ulrich, Werner Knebel, Kyra Moellmann, Peter Euteneuer
  • Patent number: 7551351
    Abstract: A microscope with evanescent sample illumination comprises a device for optically manipulating a sample.
    Type: Grant
    Filed: May 1, 2006
    Date of Patent: June 23, 2009
    Assignee: Leica Microsystems CMS GmbH
    Inventors: Heinrich Ulrich, Werner Knebel, Kyra Moellmann, Peter Euteneuer
  • Patent number: 7480046
    Abstract: A scanning microscope includes a light source for evanescently illuminating a sample disposed on a slide. A point detector receives detection light emanating from a scanning point of the sample. A beam deflection device disposed in an optical path of the detection light can shift a position of the scanning point.
    Type: Grant
    Filed: September 23, 2004
    Date of Patent: January 20, 2009
    Assignee: Leica Microsystems CMS GmbH
    Inventors: Heinrich Ulrich, Werner Knebel, Kyra Moellmann
  • Patent number: 7474462
    Abstract: A microscope with a first and a second illumination light beam for illuminating a sample, wherein the first and/or the second illumination light beam evanescently illuminates the sample. For the purpose of CARS testing, the first illumination light beam can be a pump light beam, and the second illumination light beam can be a Stokes light beam. To increase resolution, the first illumination light beam can be an excitation light beam, and the second illumination light beam can be a stimulation light beam.
    Type: Grant
    Filed: May 1, 2006
    Date of Patent: January 6, 2009
    Assignee: Leica Microsystems CMS GmbH
    Inventors: Heinrich Ulrich, Werner Knebel, Kyra Moellmann, Juergen Hoffmann
  • Patent number: 7463414
    Abstract: A microscope includes an adjustment device for positioning a specimen stage. An objective, an objective changer and/or an objective turret is coupled to the adjustment device so that a position of the objective element is adjustable by the adjustment device. A holder for the objective element may be provided coupling the objective element to the adjustment device.
    Type: Grant
    Filed: January 26, 2006
    Date of Patent: December 9, 2008
    Assignee: Leica Microsystems CMS GmbH
    Inventors: Rafael Storz, Heinrich Ulrich
  • Publication number: 20080266659
    Abstract: The invention relates to a lens (1) for total internal reflection microscopy. The lens (1) is characterized in that a light source (5, 7) and/or at least one deviating means (31, 3) which deviates the light from a light source (5, 7) into the lens and/or the emitting end (35) of an illuminating optical fiber (37) is arranged in the region of the rear focal plane (3) of the lens (1).
    Type: Application
    Filed: May 1, 2006
    Publication date: October 30, 2008
    Applicant: Leica Microsystems CMS GmbH
    Inventors: Heinrich Ulrich, Werner Knebel, Kyra Moellmann
  • Publication number: 20080193081
    Abstract: A microscope, in particular a laser scanning microscope, with an illuminating light source includes a device for combining a number of individual laser light beams into one common optical fiber. The combining device is designed and developed in order to combine beams reliably and simply even if the operating period of the microscope is long. The device for forming the common optical fiber has optical fibers which are assigned to individual laser light beams, that are connected to one another by being fused-together.
    Type: Application
    Filed: February 12, 2008
    Publication date: August 14, 2008
    Applicant: Leica Microsystems CMS GmbH
    Inventors: William C. HAY, Heinrich ULRICH
  • Publication number: 20080151226
    Abstract: A microscope with evanescent sample illumination and a method for testing samples are disclosed. A first evanescent field, which exhibits a first penetration depth in the sample, and a second evanescent field, which exhibits a second penetration depth in the sample that is greater than the first penetration depth, are produced. A detector is provided that detects the first detection light, which exits from the part of the sample illuminated with the first evanescent field, and which produces first detection light data therefrom, and the second detection light, which exits from the part of the sample illuminated with the second evanescent field, and which produces second detection light data therefrom. Furthermore, a processing module is provided for processing the first and second detection light data.
    Type: Application
    Filed: May 1, 2006
    Publication date: June 26, 2008
    Applicant: Leica Microsystems CMS GmbH
    Inventors: Andreas Hecker, Heinrich Ulrich, Werner Knebel, Kyra Moellmann