Patents by Inventor Heinz Baehr

Heinz Baehr has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7524105
    Abstract: An optical dilatometer includes a furnace, in which a sample may be laid on a sample carrier, and an optical system for measuring a length of the sample at different temperatures, windows for the passage of beams being provided on a sample chamber of the furnace. A light source and a collimator for generating a parallel beam path are situated on one side of the furnace, the length of the sample being detectable via a silhouette image by a sensor, situated on the diametrically opposite side of the furnace from the light source, and a lens system. This allows a simple length measurement without orientation of an optical system.
    Type: Grant
    Filed: April 24, 2007
    Date of Patent: April 28, 2009
    Assignee: BAEHR - Thermoanalyse GmbH
    Inventor: Heinz Baehr
  • Publication number: 20070248493
    Abstract: A furnace for performing dilatometric assays includes a closable sample chamber on which windows for the passage of beams are provided, a sample carrier having a horizontal contact surface for receiving samples situated in the sample chamber and the sample chamber being heatable via one or more heating elements. The heating elements are implemented as essentially flat on the side facing toward the sample carrier and delimit the sample chamber on the top side and the bottom side, the heating elements extending on all sides beyond the sample carrier in the horizontal direction. An especially uniform temperature distribution on the sample is thus ensured.
    Type: Application
    Filed: April 24, 2007
    Publication date: October 25, 2007
    Applicant: Baehr-Thermoanalyse GmbH
    Inventor: Heinz Baehr
  • Publication number: 20070248140
    Abstract: An optical dilatometer includes a furnace, in which a sample may be laid on a sample carrier, and an optical system for measuring a length of the sample at different temperatures, windows for the passage of beams being provided on a sample chamber of the furnace. A light source and a collimator for generating a parallel beam path are situated on one side of the furnace, the length of the sample being detectable via a silhouette image by a sensor, situated on the diametrically opposite side of the furnace from the light source, and a lens system. This allows a simple length measurement without orientation of an optical system.
    Type: Application
    Filed: April 24, 2007
    Publication date: October 25, 2007
    Applicant: Baehr-Thermoanalyse GmbH
    Inventor: Heinz Baehr