Abstract: A test head for making contact with test points of an electric component under test and with contact points on a board, for example. A plurality of spring elastic, elongated electric contact elements have opposite ends which respectively contact a test point at one end and a contact point at the other end. A plurality of at least two and preferably three guide panels are located in the space between the test points and the contact points. A respective, first, second and third opening in the first, second and third panels for each of the contact elements for each of the contact elements, with two adjacent openings for each of the contact elements being laterally offset and misaligned so that the contact element passing through them is held in a friction locked fashion.

Abstract: A test head for making contact with test points arranged close to one another of an electric component. The test head having a plurality of contact elements which can be connected to a connecting element of a test device. The contact elements are in respective feed-through openings through two or three overlying guide panels. The contact elements are axially guidable in the feed-through openings in the panel. Various ways of securing the contact elements against falling out of the test head are provided, including friction locking of the contact elements in one panel, using a securing layer at one panel, laterally offsetting one panel with respect to the others, or by different diameters along the length of the contact element, e.g. by insulation selectively applied along the length. The connecting element and the device for making contact are detachably connected.