Patents by Inventor Heinz Eschenbacher

Heinz Eschenbacher has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5680435
    Abstract: An X-ray diagnostic apparatus has a device for controlling an X-ray source with regard to the emission of an X-ray beam and a filter positioner for the introduction or removal of at least one radiation filter into or out of the beam of radiation. A monitoring device checks whether there exists a positive difference signal between an output of a dosage power regulator and a kV controller. Given the presence of a positive difference, the monitoring device controls the filter positioner with regard to the removal of the radiation filter from the beam of radiation.
    Type: Grant
    Filed: September 20, 1996
    Date of Patent: October 21, 1997
    Assignee: Siemens Aktiengesellschaft
    Inventors: Johann Seissl, Heinz Eschenbacher
  • Patent number: 5495514
    Abstract: An x-ray diagnostics installation has an x-ray source connected to a parameter setting unit which sets exposure parameters (operating characteristics) of the x-ray source, and an x-ray image intensifier video chain. The x-ray image intensifier video chain includes a processing circuit connected to a video pick-up stage and a motion detector. The processing unit controls the parameters of a filter unit for chronological filtering of the video signal. The motion detector is connected to the parameter setting unit for the x-ray source, and controls the filter unit depending on the exposure parameters which are set for a given exposure, such as the level of the video signal, the tube voltage, the radiation dose, and the imaging format of the x-ray image intensifier, all of which are set at the parameter setting unit and which characterize the exposure.
    Type: Grant
    Filed: December 12, 1994
    Date of Patent: February 27, 1996
    Assignee: Siemens Aktiengesellschaft
    Inventors: Heinz Horbaschek, Heinz Eschenbacher
  • Patent number: 4817614
    Abstract: A sectional plane of the examination subject is first scanned by focused ultrasound transmission beams in an adaptation phase. Disturbing effects from the reflected echo signals which are caused by the inhomogenities in the tissue are thereby measured. In this adaptation phase, correction values for the delay time of the signals of the elemental transducers of the ultrasound array in comparison to the standard focusing are also derived from the measured values. In a following B-image imaging phase, the delay times of the active aperture are then varied dependent on the correction values during the emission and/or during reception. The disturbing effects are thereby compensated. A method and apparatus are disclosed which are especially well-suited for linear array systems and for patients having inhomogeneous tissues.
    Type: Grant
    Filed: August 19, 1987
    Date of Patent: April 4, 1989
    Assignee: Siemens Aktiengesellschaft
    Inventors: Dietrich Hassler, Heinz Eschenbacher, Wolfgang Haerer