Patents by Inventor Helen L. Kung

Helen L. Kung has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6618150
    Abstract: A spectrometer for determining a spectrum of a light by using a mirror to reflect the light so that the light forms an intensity standing wave pattern through superposition of an incident portion of the light and a reflected portion of the light. The spectrometer is equipped with an intensity detector whose thickness is less than a shortest wavelength of the light being examined and which is semitransparent over the spectrum. The spectrometer has a mechanism to provide relative movement between the mirror and the intensity detector such that the intensity detector registers a variation of the intensity standing wave pattern. An analyzer, such as a Fourier transform analyzer, is employed to determine the spectrum of the light from that variation of the intensity standing wave pattern.
    Type: Grant
    Filed: August 16, 2001
    Date of Patent: September 9, 2003
    Assignee: The Board of Trustees of the Leland Stanford Junior University
    Inventors: James S. Harris, Jr., Helen L. Kung, David A. B. Miller
  • Patent number: 6525815
    Abstract: A transform spectrometer determines the spectrum of light based on the Talbot effect. Light to be analyzed is passed through a spatially periodic object, thereby generating a series of Talbot images. The intensities of these Talbot images at different optical distances from the spatially periodic object are then detected, and Fourier transformed to determine the spectrum of the light. Preferably, the detector comprises a spatial masking pattern such that the intensities detected are maximized at Talbot planes or at the midpoints between Talbot planes. In one embodiment, the optical distance between the spatially periodic object and the detector is changed in order to detect image intensities at different Talbot planes. In another embodiment, the detector and the spatially periodic object are positioned along a common optical axis at relative angle &thgr; such that different detector rows detect intensities at different Talbot planes.
    Type: Grant
    Filed: November 9, 2001
    Date of Patent: February 25, 2003
    Assignee: The Board of Trustees of the Leland Stanford Junior University
    Inventors: Helen L. Kung, David A. B. Miller
  • Publication number: 20020126279
    Abstract: A transform spectrometer determines the spectrum of light based on the Talbot effect. Light to be analyzed is passed through a spatially periodic object, thereby generating a series of Talbot images. The intensities of these Talbot images at different optical distances from the spatially periodic object are then detected, and Fourier transformed to determine the spectrum of the light. Preferably, the detector comprises a spatial masking pattern such that the intensities detected are maximized at Talbot planes or at the midpoints between Talbot planes. In one embodiment, the optical distance between the spatially periodic object and the detector is changed in order to detect image intensities at different Talbot planes. In another embodiment, the detector and the spatially periodic object are positioned along a common optical axis at relative angle &thgr; such that different detector rows detect intensities at different Talbot planes.
    Type: Application
    Filed: November 9, 2001
    Publication date: September 12, 2002
    Inventors: Helen L. Kung, David A.B. Miller
  • Publication number: 20020075483
    Abstract: A spectrometer for determining a spectrum of a light by using a mirror to reflect the light so that the light forms an intensity standing wave pattern through superposition of an incident portion of the light and a reflected portion of the light. The spectrometer is equipped with an intensity detector whose thickness is less than a shortest wavelength of the light being examined and which is semitransparent over the spectrum. The spectrometer has a mechanism to provide relative movement between the mirror and the intensity detector such that the intensity detector registers a variation of the intensity standing wave pattern. An analyzer, such as a Fourier transform analyzer, is employed to determine the spectrum of the light from that variation of the intensity standing wave pattern.
    Type: Application
    Filed: August 16, 2001
    Publication date: June 20, 2002
    Inventors: James S. Harris, Helen L. Kung, David A. B. Miller