Abstract: An assembly comprising a sample and a device for generating a high temperature gradient in said sample comprises: a chamber inside which the sample is placed; a resistor passing through the sample; first inductive means at the periphery of the chamber, for creating an electromagnetic field; and second inductive means that are arranged inside the chamber and connected to the resistor, and that are capable of picking up said electromagnetic field so as to make an induced current flow through said resistor, the chamber being transparent and the first inductive means comprising at least one first coil at least one coil of which contains windings separated by at least 2 mm, this separation being configured to allow an optical means for measuring deformation to be targeted.