Patents by Inventor Helmut Gunter

Helmut Gunter has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Test probe manipulator for wafer-probing apparatus
    Patent number: 5014001
    Abstract: The test-probe manipulator for a test probe for use with semiconductor wafers utilizes three adjusting spindles (50,51,52) arranged on the same side of the manipulator. The test-probe manipulator occupies little space and is easy to operate. All three axes of translational freedom perform linear motions independent of each other. Accuracy of adjustment is improved as compared to conventional devices. Easy placement on and removal from a test platform are ensured.
    Type: Grant
    Filed: May 14, 1990
    Date of Patent: May 7, 1991
    Assignee: Deutsche ITT Industries GmbH
    Inventors: Hans Schmidt, Helmut Gunter