Abstract: A device for testing contacting and/or wiring of sockets connected to a circuit board includes a housing with oppositely arranged inner side walls. First guiding elements are connected to the inner side walls and are spaced at a certain grid distance from one another. At least one testing adaptor is connected to the housing for testing one of the sockets. The testing adaptor has a flat casing with a forward end and opposite longitudinal narrow sides. A testing head is connected to the forward end. The casing further has second guiding elements connected to the longitudinal narrow sides whereby the first and the second guiding elements are slidably connected such that the testing head is movable toward and attachable to the socket for establishing electrical contact. Between the first and the second guiding elements an intermediate member is inserted. The intermediate member has a third guiding element and a fourth guiding element oppositely oriented relative to one another.

Abstract: In an arrangement for testing electrical circuit boards an intermediary adapter is disposed between the circuit board and a basic adapter. For converting a grid offset as well as a grid with smaller grid step width to the grid of contact areas in the basic adapter converters (11) are provided which on their top side have test piece-specific arrangements of contact needles (31), for example for SMD structural elements. On the underside the converters (11) are provided with contact pins (36) in a grid corresponding to the contact area bank of the basic adapter. The grid of the contact pins (36) is displaced laterally or diagonally relative to the side edges (44) of converters (11) so that by rotating the converters (11) about their longitudinal axes offsetting the contact pins (36) for contacting the contact areas of the basic adapter can be carried out.