Patents by Inventor Helmut Wersal

Helmut Wersal has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and device for measuring the thickness of non-magnetisable layers on a magnetisable base material
    Patent number: 10928178
    Abstract: The invention relates to a method for measuring the thickness of non-magnetisable layers (51) on a magnetisable base material (52), the permeability of which is not known, having a measuring probe (11), which has a probe head (17), which comprises a pot core (31) having a first and second coil (36, 37), which lie on a common geometric axis (16), and in which the first and second coils (36, 37) form a first coil pair (38), and which has a bearing calotte (21) in a common axis (16), in which the probe head (17) is placed on the layer (51) to measure the thickness of the layer (51) on the base material (52), wherein a first interaction volume is detected by the first coil pair (38) with a field focusing caused by the pot core (31), a second interaction volume is detected by a second coil par (44) with a first and second coil (42, 43), which is arranged outside the pot core (31) and jointly with the geometric axis (16) without field focusing by the pot core (21), and the detected first and second base material vo
    Type: Grant
    Filed: December 7, 2018
    Date of Patent: February 23, 2021
    Assignee: Helmut Fischer GmbH Institut für Elektronik und Messtechnik
    Inventors: Hans-Peter Vollmar, Helmut Wersal
  • METHOD AND DEVICE FOR MEASURING THE THICKNESS OF NON-MAGNETISABLE LAYERS ON A MAGNETISABLE BASE MATERIAL
    Publication number: 20190178620
    Abstract: The invention relates to a method for measuring the thickness of non-magnetisable layers (51) on a magnetisable base material (52), the permeability of which is not known, having a measuring probe (11), which has a probe head (17), which comprises a pot core (31) having a first and second coil (36, 37), which lie on a common geometric axis (16), and in which the first and second coils (36, 37) form a first coil pair (38), and which has a bearing calotte (21) in a common axis (16), in which the probe head (17) is placed on the layer (51) to measure the thickness of the layer (51) on the base material (52), wherein a first interaction volume is detected by the first coil pair (38) with a field focusing caused by the pot core (31), a second interaction volume is detected by a second coil par (44) with a first and second coil (42, 43), which is arranged outside the pot core (31) and jointly with the geometric axis (16) without field focusing by the pot core (21), and the detected first and second base material vo
    Type: Application
    Filed: December 7, 2018
    Publication date: June 13, 2019
    Inventors: Hans-Peter Vollmar, Helmut Wersal