Abstract: Latency of in-system test (IST) execution for a hardware component of an in-field (deployed) computing platform may be reduced when a value of a physical operating parameter can be changed without rebooting the computing platform. A test (e.g., patterns or vectors) is executed for varying values of the physical operating parameter (e.g., supply voltage, clock speed, temperature, noise magnitude/duration, operating current, and the like), providing the ability to detect faults in the hardware components.

Abstract: Latency of in-system test (IST) execution for a hardware component of an in-field (deployed) computing platform may be reduced when a value of a physical operating parameter can be changed without rebooting the computing platform. A test (e.g., patterns or vectors) is executed for varying values of the physical operating parameter (e.g., supply voltage, clock speed, temperature, noise magnitude/duration, operating current, and the like), providing the ability to detect faults in the hardware components.

Abstract: Power management techniques for a Universal Serial Bus (USB) include determining an idle period on one or more USB ports by a main controller circuit of a USB host controller. The main controller circuit signals a suspend to a Power Management Controller (PMC) sub-circuit of the USB host controller, in response to the determined idle period. The PMC sub-circuit stores one or more operating parameters of the one or more USB ports in response to the suspend signal. The PMC sub-circuit also maintains the idle state on the one or more USB ports in response to the suspend signal. Thereafter, the main controller circuit is placed in a low energy state while the PMC sub-circuit maintains the idle state.