Patents by Inventor HEMAN MAMAND

HEMAN MAMAND has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10520298
    Abstract: Disclosed is a method of assessing a structural defect presence in a structure, the method comprising the steps of: determining at least one critical damage strain value of the structure, capturing a first image of a surface of the structure under a first loading condition; capturing a second image of the surface of the structure under a second loading condition; assigning a position matrix on the captured first image; obtaining a deformation matrix comprising a deformation value at each position of the position matrix by using an image correlation technique on the first and second images, and by comparing deformation of corresponding parts of the surface captured therein; calculating a strain matrix using the obtained deformation matrix; and determining a micro-crack to be present at a position if an element of the strain matrix representing the strain at the position is greater than or equal to a predetermined critical damage strain value, wherein the critical damage strain value is a strain value at which
    Type: Grant
    Filed: January 12, 2016
    Date of Patent: December 31, 2019
    Assignee: BAE SYSTEMS PLC
    Inventors: Jiye Chen, Heman Mamand
  • Publication number: 20180266809
    Abstract: Disclosed is a method of assessing a structural defect presence in a structure, the method comprising the steps of: determining at least one critical damage strain value of the structure, capturing a first image of a surface of the structure under a first loading condition; capturing a second image of the surface of the structure under a second loading condition; assigning a position matrix on the captured first image; obtaining a deformation matrix comprising a deformation value at each position of the position matrix by using an image correlation technique on the first and second images, and by comparing deformation of corresponding parts of the surface captured therein; calculating a strain matrix using the obtained deformation matrix; and determining a micro-crack to be present at a position if an element of the strain matrix representing the strain at the position is greater than or equal to a predetermined critical damage strain value, wherein the critical damage strain value is a strain value at which
    Type: Application
    Filed: January 12, 2016
    Publication date: September 20, 2018
    Applicant: BAE SYSTEMS plc
    Inventors: JIYE CHEN, HEMAN MAMAND