Patents by Inventor Hendrik Willem Johan Debeye

Hendrik Willem Johan Debeye has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6901333
    Abstract: A method is disclosed for the generation and application of anisotropic elastic parameters. Anisotropic elastic parameters are generated such that, for selected seismic wave and anisotropy types, an approximation to the anisotropic modeling of seismic amplitudes is obtained by the equivalent isotropic modeling with the anisotropic elastic parameters. In seismic modeling, wavelet estimation, seismic interpretation, inversion and the interpretation and analysis of inversion results anisotropy are handled with isotropic methods, when earth elastic parameters utilized in these methods are replaced by the anisotropic elastic parameters.
    Type: Grant
    Filed: October 27, 2003
    Date of Patent: May 31, 2005
    Assignee: Fugro N.V.
    Inventors: Paul Van Riel, Hendrik Willem Johan Debeye
  • Patent number: 6876928
    Abstract: A method for determining from measured reflection data on a plurality of trace positions, a plurality of subsurface parameters. The method includes the steps of: preprocessing the measured reflection data into a plurality of partial or full stacks; specifying one or more initial subsurface parameters defining an initial subsurface model; specifying a wavelet or wavelet field for each of the partial or full stacks of the measured reflection data; calculating synthetic reflection data based on the specified wavelets and the initial subsurface parameters; optimizing an objective function, including the weighted difference between measured reflection data and synthetic reflection data for a plurality of trace positions simultaneously; and outputting the optimized subsurface parameters. A device for implementing this method is also included.
    Type: Grant
    Filed: September 26, 2003
    Date of Patent: April 5, 2005
    Assignee: Jason Geosystems B.V.
    Inventors: Paul Van Riel, Hendrik Willem Johan Debeye
  • Publication number: 20040064294
    Abstract: A method for determining from measured reflection data on a plurality of trace positions, a plurality of subsurface parameters. The method includes the steps of: preprocessing the measured reflection data into a plurality of partial or full stacks; specifying one or more initial subsurface parameters defining an initial subsurface model; specifying a wavelet or wavelet field for each of the partial or full stacks of the measured reflection data; calculating synthetic reflection data based on the specified wavelets and the initial subsurface parameters; optimizing an objective function, including the weighted difference between measured reflection data and synthetic reflection data for a plurality of trace positions simultaneously; and outputting the optimized subsurface parameters. A device for implementing this method is also included.
    Type: Application
    Filed: September 26, 2003
    Publication date: April 1, 2004
    Applicant: Jason Geosystems B.V.
    Inventors: Paul Van Riel, Hendrik Willem Johan Debeye
  • Patent number: 6665615
    Abstract: A method for determining from measured reflection data on a plurality of trace positions, a plurality of subsurface parameters. The method includes the steps of: preprocessing the measured reflection data into a plurality of partial or full stacks; specifying one or more initial subsurface parameters defining an initial subsurface model; specifying a wavelet or wavelet field for each of the partial or full stacks of the measured reflection data; calculating synthetic reflection data based on the specified wavelets and the initial subsurface parameters; optimizing an objective function, including the weighted difference between measured reflection data and synthetic reflection data for a plurality of trace positions simultaneously; and outputting the optimized subsurface parameters. A device for implementing this method is also included.
    Type: Grant
    Filed: March 26, 2001
    Date of Patent: December 16, 2003
    Assignee: Jason Geosystems B.V.
    Inventors: Paul Van Riel, Hendrik Willem Johan Debeye
  • Publication number: 20020013661
    Abstract: Disclosed is a method to estimate elastic and compositional parameters by the inversion of multiple seismic and echo-acoustic data full or partial stacks. The method utilizes the information in the amplitudes of the input seismic data sets and differences between the amplitudes in the different input data sets. The method further makes use of the contrast of the reflectivity and/or the elastic and compositional parameters and may make use of a background trend model, relationships between the parameters, control on the lateral rate of change of the parameters and constraints on the parameters or functions of parameters to enhance the results. Additionally, corrections may be made for differential time shifts between the input data sets. The method can be applied to seismic data acquired to analyze the subsurface and to echo-acoustical data acquired for medical and material analysis purposes.
    Type: Application
    Filed: March 26, 2001
    Publication date: January 31, 2002
    Applicant: Jason Geosystems B.V.
    Inventors: Paul Van Riel, Hendrik Willem Johan Debeye