Patents by Inventor Hendrik Willem Zandbergen
Hendrik Willem Zandbergen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11041788Abstract: The present invention is in the field of a cryo transfer system for use in microscopy, and a microscope comprising said system. The present invention is in the field of microscopy, specifically in the field of electron and focused ion beam microscopy (EM and FIB), and in particular Transmission Electron Microscopy (TEM). However its application is extendable in principle to any field of microscopy, especially wherein a specimen (or sample) is cooled or needs cooling.Type: GrantFiled: July 12, 2018Date of Patent: June 22, 2021Assignee: HennyZ B.V.Inventor: Hendrik Willem Zandbergen
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Publication number: 20210055534Abstract: The present invention is in the field of a vacuum transfer assembly, such as for cryotransfer, and specifically a TEM vacuum transfer assembly, which can be used in microscopy, a sample holder, a vacuum housing, a sample holder stage and a sample holder coupling unit for use in the assembly, and a microscope comprising said assembly as well as a method of vacuum transfer into a microscope.Type: ApplicationFiled: January 7, 2019Publication date: February 25, 2021Inventor: Hendrik Willem ZANDBERGEN
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Publication number: 20200141846Abstract: The present invention is in the field of a cryo transfer system for use in microscopy, and a microscope comprising said system. The present invention is in the field of microscopy, specifically in the field of electron and focused ion beam microscopy (EM and FIB), and in particular Transmission Electron Microscopy (TEM). However its application is extendable in principle to any field of microscopy, especially wherein a specimen (or sample) is cooled or needs cooling.Type: ApplicationFiled: July 12, 2018Publication date: May 7, 2020Applicant: HennyZ B.V.Inventor: Hendrik Willem ZANDBERGEN
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Publication number: 20180376537Abstract: The use of MEMS-based micro heaters for heating experiments in electron microscopy is known. Heating of a sample typically relates to a temperature increase or decrease of at least 50 K, and often at least 200 K. The present invention provides an improved heating system for use in an observation tool requiring low drift of <0.2 nm/sec, such as an electron microscope, comprising two cooperating and integrated MEMS-based micro heaters (21,22) spaced apart at a mutual distance of less than 10 mm. A first heater is a master heater (21) and capable of receiving a first amount of power, a second heater is a slave heater (22) and capable of receiving a second amount of power, wherein the first and second amounts of power are in a range from 0 mW to the total amount of power.Type: ApplicationFiled: June 30, 2016Publication date: December 27, 2018Inventor: Hendrik Willem Zandbergen
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Patent number: 9922797Abstract: An improved microreactor for use in microscopy, use of said microreactor, and a microscope comprising said reactor. The present invention is in the field of microscopy, specifically in the field of electron and focused ion beam microscopy (EM and FIB), and in particular Transmission Electron Microscopy (TEM). However its application is extendable in principle to any field of microscopy, especially wherein characteristics of a (solid) specimen (or sample) are studied in detail, such as during a reaction.Type: GrantFiled: April 28, 2017Date of Patent: March 20, 2018Assignee: TECHNISCHE UNIVERSITEIT DELFTInventor: Hendrik Willem Zandbergen
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Patent number: 9887065Abstract: A low specimen drift holder and cooler for use in microscopy, and a microscope comprising said holder. The present invention is in the field of microscopy, specifically in the field of electron and focused ion beam microscopy (EM and FIB). However it application is extendable in principle to any field of microscopy, especially wherein a specimen is cooled or needs cooling.Type: GrantFiled: June 2, 2016Date of Patent: February 6, 2018Assignee: TECHNISCHE UNIVERSITEIT DELFTInventor: Hendrik Willem Zandbergen
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Publication number: 20170236685Abstract: An improved microreactor for use in microscopy, use of said microreactor, and a microscope comprising said reactor. The present invention is in the field of microscopy, specifically in the field of electron and focused ion beam microscopy (EM and FIB), and in particular Transmission Electron Microscopy (TEM). However its application is extendable in principle to any field of microscopy, especially wherein characteristics of a (solid) specimen (or sample) are studied in detail, such as during a reaction.Type: ApplicationFiled: April 28, 2017Publication date: August 17, 2017Inventor: Hendrik Willem Zandbergen
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Patent number: 9548184Abstract: A microreactor for use in a microscope, comprising a first and second cove layer (13), which cover layers are both at least partly transparent to an electron beam (14) of an electron microscope, and extend next to each other at a mutual distance from each other and between which a chamber (15) is enclosed, wherein an inlet (4) and an outlet (5) are provided for feeding fluid through the chamber and wherein heating means (8) are provided for heating the chamber and/or elements present therein.Type: GrantFiled: September 12, 2005Date of Patent: January 17, 2017Assignees: Technische Universiteit Delft, Stichting voor de Technische WetenschappenInventors: Jan Fredrik Creemer, Hendrik Willem Zandbergen, Pasqualina Maria Sarro
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Patent number: 9524850Abstract: A holder assembly comprises a first and a separable second part, the first part detachable from the second part, the first part comprising a tube and an environmental cell interface and the second part comprising an electron microscope interface, as a result of which the first part can be cleaned at high temperatures without exposing the second part to said high temperature. By forming the holder assembly from detachable parts, one part can be cleaned by heating it to a high temperature of, for example, 1000° C., clogging in the tubes can be removed by reduction of carbon, while keeping the other part (often comprising mechanical fittings, ball bearing, sliders, or such like) cool. The cleaning can be enhanced by blowing, for example, oxygen or hydrogen through the tubes.Type: GrantFiled: February 15, 2013Date of Patent: December 20, 2016Assignee: FEI COMPANYInventors: Hendrik Willem Zandbergen, Pleun Dona, Gerardus Nicolaas Anne van Veen
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Publication number: 20160276126Abstract: A low specimen drift holder and cooler for use in microscopy, and a microscope comprising said holder. The present invention is in the field of microscopy, specifically in the field of electron and focused ion beam microscopy (EM and FIB). However it application is extendable in principle to any field of microscopy, especially wherein a specimen is cooled or needs cooling.Type: ApplicationFiled: June 2, 2016Publication date: September 22, 2016Inventor: Hendrik Willem Zandbergen
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Patent number: 9356233Abstract: A nanobridge or microbridge comprising a non-magnetic alloy of at least a first and second metal, the metals being selected from Group 8, 9, 10 and 11, wherein the first metal is present in a range of 50-95 wt. %, and memristors comprising one or more of same.Type: GrantFiled: May 29, 2014Date of Patent: May 31, 2016Assignee: TECHNISCHE UNIVERSITEIT DELFTInventors: Tatiana Kozlova, Maria Rudneva, Hendrik Willem Zandbergen
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Publication number: 20150185461Abstract: A holder and multicontact device for use in microscopy, a method of loading the multicontact device, a container for the multicontact device, and a microscope comprising said holder and device. The invention is in the field of microscopy, specifically in the field of electron and focused ion beam microscopy. However, its application is extendable in principle to any field of microscopy.Type: ApplicationFiled: March 13, 2015Publication date: July 2, 2015Inventor: Hendrik Willem Zandbergen
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Patent number: 8624185Abstract: Disclosed are methods for preparing samples that include forming a first channel in a material by directing a first plurality of noble gas ions at the material, forming a second channel in the material by directing a second plurality of noble gas ions at the material, where the second channel is spaced from the first channel so that a portion of the material between channels has a mean thickness of 100 nm or less, and detaching the portion from the material to yield the sample.Type: GrantFiled: September 15, 2011Date of Patent: January 7, 2014Assignee: Carl Zeiss Microscopy, LLCInventors: Diederik Jan Maas, Maria Rudneva, Emile van Veldhoven, Hendrik Willem Zandbergen
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Publication number: 20120199737Abstract: Disclosed are methods for preparing samples that include forming a first channel in a material by directing a first plurality of noble gas ions at the material, forming a second channel in the material by directing a second plurality of noble gas ions at the material, where the second channel is spaced from the first channel so that a portion of the material between channels has a mean thickness of 100 nm or less, and detaching the portion from the material to yield the sample.Type: ApplicationFiled: September 15, 2011Publication date: August 9, 2012Applicant: CARL ZEISS NTS, LLCInventors: Diederik Jan Maas, Maria Rudneva, Emile van Veldhoven, Hendrik Willem Zandbergen
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Publication number: 20080179518Abstract: A microreactor for use in a microscope, comprising a first and second cove layer (13), which cover layers are both at least partly transparent to an electron beam (14) of an electron microscope, and extend next to each other at a mutual distance from each other and between which a chamber (15) is enclosed, wherein an inlet (4) and an outlet (5) are provided for feeding fluid through the chamber and wherein heating means (8) are provided for heating the chamber and/or elements present therein.Type: ApplicationFiled: September 12, 2005Publication date: July 31, 2008Inventors: Jan Fredrik Creemer, Hendrik Willem Zandbergen, Pasqualina Maria Sarro
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Patent number: 7238953Abstract: A specimen holder for an electron microscope, comprising a rod-shaped part, which is provided near one end with a tip, which tip is arranged to receive a specimen, the rod-shaped part, in use, extending with at least the tip into the electron microscope, held by clamping means present in the electron microscope, wherein first temperature control means are provided to control the temperature of the rod-shaped part and/or the clamping means, such that this rod-shaped pan and the clamping means substantially have the same temperature, at least at the location of their contact surfaces.Type: GrantFiled: June 24, 2003Date of Patent: July 3, 2007Assignee: Technische Universiteit DelftInventor: Hendrik Willem Zandbergen