Abstract: Systems and methods for hardware-based initialization of memory circuitry. In some embodiments, a method may include, after completion and/or independently of an integrity test of a memory circuit, generating a sequence of random logic values using a Built-In-Self-Test (BIST) circuit. The method may further include initializing the memory circuit with the sequence of random logic values using the BIST circuit. In some implementations, the sequence of logic values may be generated using memory circuit identification, chip identification, and/or clock information as a seed state.

Abstract: A content addressable memory (CAM) and methods of operating a CAM are provided. The method for operating a CAM includes: during a first mode, performing a search function in a CAM bit array, the search result output at a match port of the CAM bit array; and during a second mode, columnwise reading data in the CAM bit array, the read column data output at the match data port of the CAM bit array. The method may include writing the CAM bit array with a predetermined data pattern. The method may further include providing an indication of pass/fail based upon comparing the read column data with expected data.

Abstract: A memory system includes a memory and a built-in self-test (BIST) unit coupled to the memory. The BIST unit is configured to run a test pattern on the memory to accumulate a fault signature, and store fault signature information based on the accumulated fault signature at multiple locations in the memory.

Abstract: A memory system includes a memory and a built-in self-test (BIST) unit coupled to the memory. The BIST unit is configured to run a test pattern on the memory to accumulate a fault signature, and store fault signature information based on the accumulated fault signature at multiple locations in the memory.

Abstract: Systems and methods for hardware-based initialization of memory circuitry. In some embodiments, a method may include, after completion and/or independently of an integrity test of a memory circuit, generating a sequence of random logic values using a Built-In-Self-Test (BIST) circuit. The method may further include initializing the memory circuit with the sequence of random logic values using the BIST circuit. In some implementations, the sequence of logic values may be generated using memory circuit identification, chip identification, and/or clock information as a seed state.

Abstract: Systems and methods are provides that access a tag cell file in computer storage media, wherein the tag cell file is associated with a abstract representation of a component to be included in a semiconductor device. The tag cell file includes a tag that identifies the component as being based on intellectual property of a third party. The abstract representation of the component is translated to a computer data file for manufacturing the semiconductor device. The tag associated with the component is included in the data file, and the data file may be parsed by accounting programs to determine the extent of usage of the intellectual property in the semiconductor device.

Abstract: Systems and methods are provides that access a tag cell file in computer storage media, wherein the tag cell file is associated with a abstract representation of a component to be included in a semiconductor device. The tag cell file includes a tag that identifies the component as being based on intellectual property of a third party. The abstract representation of the component is translated to a computer data file for manufacturing the semiconductor device. The tag associated with the component is included in the data file, and the data file may be parsed by accounting programs to determine the extent of usage of the intellectual property in the semiconductor device.