Abstract: An x-ray image detector suitable for radiology has an active matrix substrate with scanning and read-out circuits. Over this active matrix substrate, which can be a two dimensional array of TFTs associated with a storage capacitance, there is deposited a photoreceptor made of a thin layer of amorphous selenium based multilayer structure. The photoreceptor is covered with a light-transparent electrode on top of which there is provided a scintillator. The indices of refraction of the scintillator and of the selenium based multilayer may be matched with the use of the biasing electrode.

Abstract: An x-ray image detector suitable for radiology has an active matrix substrate with scanning and read-out circuits. Over this active matrix substrate, which can be a two dimensional array of TFTs associated with a storage capacitance, there is deposited a photoreceptor made of a thin layer of amorphous selenium based multilayer structure. The photoreceptor is covered with a light-transparent electrode on top of which there is provided a scintillator. The indices of refraction of the scintillator and of the selenium based multilayer may be matched with the use of the biasing electrode.

Abstract: A direct conversion digital x-ray detector is provided with inherent high voltage protection for static and dynamic imaging. The detector has an n-channel active matrix TFT array, a coplanar photoconductor structure and a high voltage biasing electrode. In order to achieve high voltage protection, the biasing electrode is set to a negative potential and the TFT “off” gate voltage is set to a predetermined negative value, such that the TFT is essentially non-conductive.

Abstract: A method of forming a planar semiconductor device, such as an array of APDs, includes the steps of doping a substantially planar block of n type semiconductor material with a p type dopant in accordance with a selected pattern to form a plurality of n type wells in the block surrounded by a foundation of p type semiconductor material. Each n type well is disposed so as to respectively adjoin a first surface of the block and such that a respective p-n junction is formed between the n type material in the well and the p type material foundation. The n type semiconductor material in each well has a substantially constant concentration of n type dopant throughout the n type material; the concentration of p type dopant in the foundation has a positive gradient extending from the p-n junction towards the second surface such that the peak surface electric field of the p-n junction in each well is less than the bulk electric field of the same p-n junction.

Abstract: A radiation imager comprising an array of scintillator elements optically coupled to a photodetector array comprises a dielectric layer extending around at least the sidewalls of the scintillator elements, and preferably over the surface of the scintillator elements through which the incident radiation enters, and an optically reflective layer disposed over the dielectric layer. The dielectric layer has an optical index that is less than that of the scintillator material, and consequently light collection efficiency of the scintillator is improved as light photons generated in the scintillator reflected back into the scintillator both at the interface of the scintillator and the dielectric layer and at the optically reflective layer.

Abstract: A large area radiation imager having a scintillator, an amorphous selenium photosensor, and a non-linear high voltage protective device employs a selected biasing voltage between about 100 volts and 1000 volts at the selenium photosensor to cause the photosensor to exhibit avalanche multiplication. The photosensor has an area not less than about 100 square centimeters. The amorphous selenium is doped slightly with arsenic or arsenic and tellurium. The device is advantageously coupled to a data read and reset circuit to selectively read charge generated in pixels of the photosensor. The read and data circuit is protected from an overvoltage condition by the non linear high voltage protective device, such as a protective thin film transistor or a two terminal protective device. The protective TFT is structured to have a relatively thick gate dielectric layer, which thickness is selected to cause the protective TFT to have a threshold voltage corresponding to a desired protective voltage.

Abstract: A radiation imaging device has a plurality of scintillator elements that are each optically coupled to a plurality of internal gain photodetectors. Each photodetector is electrically coupled to a respective detect and hold circuit which amplifies and stores the pulse generated by the photodetector; the stored pulses are sampled via a multiplexed switching arrangement to allow the stored signal from each detect and hold circuit to be processed to produce a digitized imaging signal which corresponds to the energy level of, and location on the array of, the detected incident radiation. The digitized imaging signal is supplied to display memory and analysis equipment for the device.