Abstract: An input device can be integrated within an electronic device and/or operably connected to an electronic device through a wired or wireless connection. The input device can include one or more force sensors positioned below a cover element of the input device or an input surface of the electronic device. The input device can include other components and/or functionality, such as a biometric sensor and/or a switch element.

Abstract: An input device can be integrated within an electronic device and/or operably connected to an electronic device through a wired or wireless connection. The input device can include one or more force sensors positioned below a cover element of the input device or an input surface of the electronic device. The input device can include other components and/or functionality, such as a biometric sensor and/or a switch element.

Abstract: An input device can be integrated within an electronic device and/or operably connected to an electronic device through a wired or wireless connection. The input device can include one or more force sensors positioned below a cover element of the input device or an input surface of the electronic device. The input device can include other components and/or functionality, such as a biometric sensor and/or a switch element.

Abstract: An input device can be integrated within an electronic device and/or operably connected to an electronic device through a wired or wireless connection. The input device can include one or more force sensors positioned below a cover element of the input device or an input surface of the electronic device. The input device can include other components and/or functionality, such as a biometric sensor and/or a switch element.

Abstract: In one embodiment, an aerosol particle collector includes a duct defining a flow path configured to remove larger particles from aerosol flowing through the duct and to store the removed particles in the duct while maintaining a uniform rate of aerosol flow throughout a predetermined useful life of the duct even as stored aerosol particles accumulate in the duct. In another embodiment, an aerosol particle collector includes a duct and a plurality of baffles in the duct. The duct has an elongated inlet extending along a length of the duct and an outlet located at one end of the length of the duct. A first one of the baffles extends along a first side of the duct for deflecting incoming aerosol toward a second side of the duct opposite the first side. A second one of the baffles is for deflecting aerosol toward the outlet.

Abstract: In one embodiment, an aerosol particle collector includes a duct defining a flow path configured to remove larger particles from aerosol flowing through the duct and to store the removed particles in the duct while maintaining a uniform rate of aerosol flow throughout a predetermined useful life of the duct even as stored aerosol particles accumulate in the duct. In another embodiment, an aerosol particle collector includes a duct and a plurality of baffles in the duct. The duct has an elongated inlet extending along a length of the duct and an outlet located at one end of the length of the duct. A first one of the baffles extends along a first side of the duct for deflecting incoming aerosol toward a second side of the duct opposite the first side. A second one of the baffles is for deflecting aerosol toward the outlet.

Abstract: In a MEMS device employing a beam supported by transverse arms, potential bowing of the transverse arms caused by fabrication processes, temperature or local self-heating from resistive losses is accommodated by flexible terminations of the transverse arms. Alternatively, this bowing is controlled so as to provide selective biasing to the beam or mechanical advantage in the sensing of beam motion.

Abstract: In a MEMS device employing a beam supported by transverse arms, potential bowing of the transverse arms caused by fabrication processes, temperature or local self-heating from resistive losses is accommodated by flexible terminations of the transverse arms. Alternatively, this bowing is controlled so as to provide selective biasing to the beam or mechanical advantage in the sensing of beam motion.

Abstract: In a MEMS device employing a beam supported by transverse arms, potential bowing of the transverse arms caused by fabrication processes, temperature or local self-heating from resistive losses is accommodated by flexible terminations of the transverse arms. Alternatively, this bowing is controlled so as to provide selective biasing to the beam or mechanical advantage in the sensing of beam motion.

Abstract: In a MEMS device employing a beam supported by transverse arms, potential bowing of the transverse arms caused by fabrication processes, temperature or local self-heating from resistive losses is accommodated by flexible terminations of the transverse arms. Alternatively, this bowing is controlled so as to provide selective biasing to the beam or mechanical advantage in the sensing of beam motion.