Abstract: A sample block (1) and a sample block holder (51) for use in the analysis of material samples, such as rock drill cuttings (24), using a scanning electron microscope. The sample block (1) is provided with a profile that facilitates alignment within the sample block holder (51) that ensures that a sample block (1) that is inspected and then subsequently re-inspected remains in the same orientation for the first and second inspections. Areas of interest of the rock drill cuttings (24) identified in the first inspection can thus be reliably inspected during the second inspection because the possibility of the sample block (1) being submitted in a different orientation has been removed.