Abstract: A self-testing contact closure test circuit and method in which invalid logic states are artificially created in order to simulate a switch malfunction, and thus to determine whether the testing circuitry correctly identifies the invalid state. The system is designed to be used with switches such as those incorporating form "C" arrangements having two pairs of contacts which under normal circumstances are in opposite states.

Abstract: Each of the either normally closed or normally open switches, in an n out of m voted power interface circuit having parallel connected groups of serially connected switches, is shunted by a high impedance resistor to form a leakage path through each group of switches. A detector associated with each group of switches, and responsive to the change of impedance produced by actuation of a resistor shunted switch in the group, generates an output signal, preferably a one bit digital signal, indicative of the state of the switches in the group in response to a sequence of test signals which selectively actuate fewer switches than are required to actuate the load controlled by the power interface. Compensation for large variations in supply voltage is provided by incorporating each group of switches into a resistance measuring bridge circuit in which the digital output signal is generated by a comparator connected across the bridge. Preferably, the bridge circuits share common reference voltage generating legs.

Abstract: An apparatus is provided for sensing the state of high voltage contact inputs in a process control system. Lower voltage contact closure input modules cooperate with a reference bus and reference bus regulator to reduce the voltage drop across an input module when a pair of contacts is closed, thereby reducing the energy dissipated and heat created by the input module.