Abstract: A method, system, and computer program product are disclosed for implementing enhanced noise impact on function (NIOF) analysis of an IC design having nets in multiple different variable voltage domains next to each other and modeling all multiple worst-case victim-aggressor voltage configurations in a single run leveraging noise abstracts characterized at a single voltage corner. The NIOF analysis enables accurately identifying incorrect victim switching or functional fails, effectively and efficiently providing design verification and the ability to sign-off an IC design with a single run, and enable modifying an integrated circuit design to fix NIOF failures, and fabricating an integrated circuit.