Patents by Inventor Henry L. Buijs

Henry L. Buijs has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11860148
    Abstract: Devices, systems, and methods for determining gas characteristics to monitor transformer operation include extracting gas from transformer fluid for analysis.
    Type: Grant
    Filed: September 29, 2020
    Date of Patent: January 2, 2024
    Assignee: ABB Schweiz AG
    Inventors: Henry L. Buijs, Louis-Philippe A. Bibeau, Alex Ouellet-Belanger, Raphael N. Desbiens
  • Patent number: 11796455
    Abstract: Devices, systems, and methods for determining gas characteristics to monitor transformer operation include extracting gas from transformer fluid for analysis.
    Type: Grant
    Filed: March 10, 2020
    Date of Patent: October 24, 2023
    Assignee: ABB Schweiz AG
    Inventors: Henry L. Buijs, Raphael N. Desbiens
  • Publication number: 20210020355
    Abstract: Devices, systems, and methods for determining gas characteristics to monitor transformer operation include extracting gas from transformer fluid for analysis.
    Type: Application
    Filed: September 29, 2020
    Publication date: January 21, 2021
    Inventors: Henry L. Buijs, Louis-Philippe A. Bibeau, Alex Ouellet-Belanger, Raphael N. Desbiens
  • Patent number: 10832854
    Abstract: Devices, systems, and methods for determining gas characteristics to monitor transformer operation include extracting gas from transformer fluid for analysis.
    Type: Grant
    Filed: March 10, 2020
    Date of Patent: November 10, 2020
    Assignee: ABB Schweiz AG
    Inventors: Henry L. Buijs, Louis-Philippe A. Bibeau, Alex Ouellet-Belanger, Raphael N. Desbiens
  • Publication number: 20200211761
    Abstract: Devices, systems, and methods for determining gas characteristics to monitor transformer operation include extracting gas from transformer fluid for analysis.
    Type: Application
    Filed: March 10, 2020
    Publication date: July 2, 2020
    Inventors: Henry L. Buijs, Louis-Philippe A. Bibeau, Alex Ouellet-Belanger, Raphael N. Desbiens
  • Publication number: 20200209152
    Abstract: Devices, systems, and methods for determining gas characteristics to monitor transformer operation include extracting gas from transformer fluid for analysis.
    Type: Application
    Filed: March 10, 2020
    Publication date: July 2, 2020
    Inventors: Henry L. Buijs, Raphael N. Desbiens
  • Patent number: 10585036
    Abstract: Devices, systems, and methods for determining gas characteristics to monitor transformer operation include extracting gas from transformer fluid for analysis.
    Type: Grant
    Filed: March 13, 2017
    Date of Patent: March 10, 2020
    Assignee: ABB Schweiz AG
    Inventors: Henry L. Buijs, Raphael N. Desbiens
  • Patent number: 10586649
    Abstract: Devices, systems, and methods for determining gas characteristics to monitor transformer operation include extracting gas from transformer fluid for analysis.
    Type: Grant
    Filed: March 13, 2017
    Date of Patent: March 10, 2020
    Assignee: ABB Schweiz AG
    Inventors: Henry L. Buijs, Louis-Philippe A. Bibeau, Alex Ouellet-Belanger, Raphael N. Desbiens
  • Patent number: 10101271
    Abstract: A method for performing infrared analysis for measuring hydrocarbon contamination in water includes providing light from a light source; directing light from the light source through an experimental water sample; detecting the light transmitted from the experimental water sample; and determining a level of hydrocarbon contamination in the experimental water sample based on the light loss in the range between about 5700 cm?1 and 6300 cm?1. An apparatus for performing infrared analysis for measuring hydrocarbon contamination in water includes a controller operative to determine light loss through the sample cell and to determine a level of hydrocarbon contamination in the experimental water sample based on the light loss in the range between about 5700 cm?1 and 6300 cm?1.
    Type: Grant
    Filed: December 21, 2016
    Date of Patent: October 16, 2018
    Assignee: ABB Schweiz AG
    Inventor: Henry L. Buijs
  • Publication number: 20180259451
    Abstract: Devices, systems, and methods for determining gas characteristics to monitor transformer operation include extracting gas from transformer fluid for analysis.
    Type: Application
    Filed: March 13, 2017
    Publication date: September 13, 2018
    Inventors: Henry L. Buijs, Louis-Philippe A. Bibeau, Alex Ouellet-Berlanger, Raphael N. Desbiens
  • Publication number: 20180259444
    Abstract: Devices, systems, and methods for determining gas characteristics to monitor transformer operation include extracting gas from transformer fluid for analysis.
    Type: Application
    Filed: March 13, 2017
    Publication date: September 13, 2018
    Inventors: Henry L. Buijs, Raphael N. Desbiens
  • Publication number: 20180172586
    Abstract: A method for performing infrared analysis for measuring hydrocarbon contamination in water includes providing light from a light source; directing light from the light source through an experimental water sample; detecting the light transmitted from the experimental water sample; and determining a level of hydrocarbon contamination in the experimental water sample based on the light loss in the range between about 5700 cm?1 and 6300 cm?1. An apparatus for performing infrared analysis for measuring hydrocarbon contamination in water includes a controller operative to determine light loss through the sample cell and to determine a level of hydrocarbon contamination in the experimental water sample based on the light loss in the range between about 5700 cm?1 and 6300 cm?1.
    Type: Application
    Filed: December 21, 2016
    Publication date: June 21, 2018
    Inventor: Henry L. Buijs
  • Patent number: 9146158
    Abstract: A four port scanning Michelson interferometer suppresses self-emission by using either a beamsplitter that is uncoated or a beamsplitter that has reflection enhancing dielectric coatings in the splitting and combining areas of the substrate on opposite sides of the substrate. Both beamsplitters are fabricated from infrared optical materials that have a predetermined absorptivity in a predetermined wavelength interval which is from 2 ?m (5000 cm?1) to 13 ?m (770 cm?1) in the infrared. The optical materials of the uncoated beamsplitter are selected from a group of materials made up of ZnSe, ZnS, CdS, CdTe, Silicon, Germanium or Diamond. The optical materials of the other beamsplitter are selected from a group of materials made up of KBr, KCl, NaCl, CsI, BaF, CaF and the like.
    Type: Grant
    Filed: January 30, 2012
    Date of Patent: September 29, 2015
    Assignee: ABB Inc.
    Inventor: Henry L. Buijs
  • Patent number: 8542423
    Abstract: An optical scanning or positioning mechanism has a head on which optical components are mounted and an actuator coupled to the head to cause the head to move when the actuator is actuated. There are one or more sets of flexure bearings mounted in the mechanism. The flexure bearings have a restoring torque when moved from a rest position. The bearings are coupled to the head to allow the head to move when actuated by the actuator. One or more magnets are mounted in the mechanism in a location other than in the actuator to compensate for the flexure bearings restoring torque.
    Type: Grant
    Filed: January 8, 2009
    Date of Patent: September 24, 2013
    Assignee: ABB Inc.
    Inventors: Mathieu J. Demers, Jean-Thomas Landry, Henry L. Buijs
  • Publication number: 20120194822
    Abstract: A four port scanning Michelson interferometer suppresses self-emission by using either a beamsplitter that is uncoated or a beamsplitter that has reflection enhancing dielectric coatings in the splitting and combining areas of the substrate on opposite sides of the substrate. Both beamsplitters are fabricated from infrared optical materials that have a predetermined absorptivity in a predetermined wavelength interval which is from 2 ?m (5000 cm?1) to 13 ?m (770 cm?1) in the infrared. The optical materials of the uncoated beamsplitter are selected from a group of materials made up of ZnSe, ZnS, CdS, CdTe, Silicon, Germanium or Diamond. The optical materials of the other beamsplitter are selected from a group of materials made up of KBr, KCl, NaCl, CsI, BaF, CaF and the like.
    Type: Application
    Filed: January 30, 2012
    Publication date: August 2, 2012
    Applicant: ABB BOMEM INC.
    Inventor: Henry L. Buijs
  • Patent number: 8014965
    Abstract: A spectrometric system has a primary channel with a signal waveform and a reference channel with a signal waveform. A digital representation of the primary signal waveform and a digital representation of the reference signal waveform to provide a digital output representing the primary signal at datum points synchronized with the reference signal are processed by computing the Fourier transform of the primary signal waveform and using a fast reverse non-uniform discrete Fourier Transform technique to compute the reverse non-uniform discrete Fourier transform of the Fourier transform of the primary signal waveform to provide the digital output representing the primary signal at datum points synchronized with the reference signal.
    Type: Grant
    Filed: February 21, 2007
    Date of Patent: September 6, 2011
    Assignee: ABB Bomen
    Inventors: Raphaƫl Desbiens, Henry L. Buijs
  • Publication number: 20110038021
    Abstract: An optical scanning or positioning mechanism has a head on which optical components are mounted and an actuator coupled to the head to cause the head to move when the actuator is actuated. There are one or more sets of flexure bearings mounted in the mechanism. The flexure bearings have a restoring torque when moved from a rest position. The bearings are coupled to the head to allow the head to move when actuated by the actuator. One or more magnets are mounted in the mechanism in a location other than in the actuator to compensate for the flexure bearings restoring torque.
    Type: Application
    Filed: January 8, 2009
    Publication date: February 17, 2011
    Inventors: Mathieu J. Demers, James T. Landry, Henry L. Buijs
  • Patent number: 7480055
    Abstract: A two-beam interferometer for Fourier Transform spectroscopy has a double pivot scanning mechanism. The interferometer has two rigid pendulums that are each rotatable to swing around an associated one of distinct axes of rotation. A linkage links the two rigid pendulums to each other and constrains their rotation relative to each other. The interferometer has bearings, which may be flexure bearings, for rotatably mounting the two pendulums to swing around an associated one of the distinct axes of rotation and a first and a second bearing linking the linkage to an associated one of the pendulums. The two rigid pendulums, the linkage and the bearings can be a monolithic structure.
    Type: Grant
    Filed: January 12, 2007
    Date of Patent: January 20, 2009
    Assignee: ABB Bomem Inc.
    Inventors: Henry L. Buijs, Jacques McKinnon
  • Publication number: 20080198374
    Abstract: A spectrometric system has a primary channel with a signal waveform and a reference channel with a signal waveform. A digital representation of the primary signal waveform and a digital representation of the reference signal waveform to provide a digital output representing the primary signal at datum points synchronized with the reference signal are processed by computing the Fourier transform of the primary signal waveform and using a fast reverse non-uniform discrete Fourier Transform technique to compute the reverse non-uniform discrete Fourier transform of the Fourier transform of the primary signal waveform to provide the digital output representing the primary signal at datum points synchronized with the reference signal.
    Type: Application
    Filed: February 21, 2007
    Publication date: August 21, 2008
    Inventors: Raphael Desbiens, Henry L. Buijs
  • Publication number: 20080170232
    Abstract: A two-beam interferometer for Fourier Transform spectroscopy has a double pivot scanning mechanism. The interferometer has two rigid pendulums that are each rotatable to swing around an associated one of distinct axes of rotation. A linkage links the two rigid pendulums to each other and constrains their rotation relative to each other. The interferometer has bearings, which may be flexure bearings, for rotatably mounting the two pendulums to swing around an associated one of the distinct axes of rotation and a first and a second bearing linking the linkage to an associated one of the pendulums. The two rigid pendulums, the linkage and the bearings can be a monolithic structure.
    Type: Application
    Filed: January 12, 2007
    Publication date: July 17, 2008
    Inventors: Henry L. Buijs, Jacques McKinnon