Abstract: A method for measuring noise parameters includes generating a noise signal at a noise source. The noise signal includes a first input signal at a first frequency and a second input signal at a second frequency. The first input signal and the second input signal are modulated onto a carrier to generate a modulated signal. The modulated signal is attenuated to a desired power level and applied to a device under test to obtain a noise measurement.

Abstract: According to one embodiment of the invention, a method for testing a device is provided. The method includes testing an electronic device having a first operating frequency by a tester device having a second operating frequency. The method also includes determining, during the test, a frequency difference between the first operating frequency and the second operating frequency. The method also includes initiating an equalization of the first and the second operating frequencies using a signal indicative of the frequency difference.