Abstract: A test method for a switch matrix (10) of a liquid-crystal display employs a signal source (40, 42) to drive a row line (20) of the matrix and employs current sensors (56, 58, and 60) to measure the resultant current flow. Errors are detected by observing departures of the measured currents from expected values. To increase the sensitivity of the current measurement to the capacitance in the location at which the associated column line (14, 16, or 18) intersects the driven row line (20), return connections for the source (40, 42) are made directly to the contact pads (26, 28) of the row lines not currently being driven and column lines not currently being sensed.

Abstract: An AC signal source (26) in series with a variable DC source (34) drives a gate line of an LCD-display drive matrix (10), and current meters (28, 30, 32) monitor the resultant currents in the drain lines. By comparing the thus-measured transadmittance both with and without enabling values of the DC-source output, one can test the matrix (10) for defects.

Abstract: This disclosure is concerned with a new technique for automatically measuring impedance (though the process is also applicable to other parameters and characteristics as well) wherein a series of voltages are sequentially presented to a common detector and analog-to-digital converter, the numerical values of which voltages are of themselves meaningless, but from which, with the aid of microprocessor calculating equipment, ratios may be calculated that indicate impedance (or other parameters).

Abstract: This disclosure is concerned with a novel front-end circuit for impedance measuring circuits and the like, involving separately or alternately operated grounding switches for connecting the free terminals of unknown and standard impedances, series-connected at a common terminal, to ground, for enabling separate selected voltage measurements between the unknown and standard, and with the series-connected impedances fed from a floating transformer; the circuit avoiding errors due to low switch impedances and obviating dependence upon capacitance from either side of the unknown impedance to ground and upon the series impedance involved in connections or leads to the unknown impedance.

Abstract: This disclosure is concerned with a new technique for automatically measuring impedance (though the process is also applicable to other parameters and characteristics as well) wherein a series of voltages are sequentially presented to a common detector and analog-to-digital converter, the numerical values of which voltages are of themselves meaningless, but from which, with the aid of microprocessor calculating equipment, ratios may be calculated that indicate impedance (or other parameters).

Abstract: This disclosure is concerned with novel approximations to sine-wave sampling by successive measurements and digital conversion in phase-sensitive detection circuits, simplifying switching requirements and providing harmonic immunity.