Patents by Inventor Herbert O. Funsten
Herbert O. Funsten has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 7781730Abstract: Time-of-flight mass spectrometer comprising a first drift region and a second drift region enclosed within an evacuation chamber; a means of introducing an analyte of interest into the first drift region; a pulsed ionization source which produces molecular ions from said analyte of interest; a first foil positioned between the first drift region and the second drift region, which dissociates said molecular ions into constituent atomic ions and emits secondary electrons; an electrode which produces secondary electrons upon contact with a constituent atomic ion in second drift region; a stop detector comprising a first ion detection region and a second ion detection region; and a timing means connected to the pulsed ionization source, to the first ion detection region, and to the second ion detection region.Type: GrantFiled: April 28, 2008Date of Patent: August 24, 2010Assignee: Los Alamos National Security, LLCInventor: Herbert O. Funsten
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Publication number: 20080277577Abstract: Time-of-flight mass spectrometer comprising a first drift region and a second drift region enclosed within an evacuation chamber; a means of introducing an analyte of interest into the first drift region; a pulsed ionization source which produces molecular ions from said analyte of interest; a first foil positioned between the first drift region and the second drift region, which dissociates said molecular ions into constituent atomic ions and emits secondary electrons; an electrode which produces secondary electrons upon contact with a constituent atomic ion in second drift region; a stop detector comprising a first ion detection region and a second ion detection region; and a timing means connected to the pulsed ionization source, to the first ion detection region, and to the second ion detection region.Type: ApplicationFiled: April 28, 2008Publication date: November 13, 2008Inventor: Herbert O. Funsten
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Patent number: 7385188Abstract: A linear electric field ion mass spectrometer having an evacuated enclosure with means for generating a linear electric field located in the evacuated enclosure and means for injecting a sample material into the linear electric field. A source of pulsed ionizing radiation injects ionizing radiation into the linear electric field to ionize atoms or molecules of the sample material, and timing means determine the time elapsed between ionization of atoms or molecules and arrival of an ion out of the ionized atoms or molecules at a predetermined position.Type: GrantFiled: February 14, 2006Date of Patent: June 10, 2008Assignee: Los Alamos National Security, LLCInventors: Herbert O. Funsten, William C. Feldman
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Patent number: 7217918Abstract: A detector element for mass spectrometry of a flux of heavy and light ions, that includes: a first detector to detect light ions that transit through a foil operatively placed in front of the first detector, and a second detector that detects the flux of heavy and light ions.Type: GrantFiled: February 14, 2006Date of Patent: May 15, 2007Assignee: Los Alamos National Security, LLCInventors: Herbert O. Funsten, Eric E. Dors, Ronnie W. Harper, Daniel B. Reisenfeld
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Patent number: 7019446Abstract: An apparatus for electron multiplication by transmission that is designed with at least one foil having a front side for receiving incident particles and a back side for transmitting secondary electrons that are produced from the incident particles transiting through the foil. The foil thickness enables the incident particles to travel through the foil and continue on to an anode or to a next foil in series with the first foil. The foil, or foils, and anode are contained within a supporting structure that is attached within an evacuated enclosure. An electrical power supply is connected to the foil, or foils, and the anode to provide an electrical field gradient effective to accelerate negatively charged incident particles and the generated secondary electrons through the foil, or foils, to the anode for collection.Type: GrantFiled: September 25, 2003Date of Patent: March 28, 2006Assignee: The Regents of the University of CaliforniaInventors: Herbert O. Funsten, Juan R. Baldonado, Eric E. Dors, Ronnie W. Harper, Ruth M. Skoug
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Patent number: 6806467Abstract: A continuous time-of-flight mass spectrometer having an evacuated enclosure with means for generating an electric field located in the evacuated enclosure and means for injecting a sample material into the electric field. A source of continuous ionizing radiation injects ionizing radiation into the electric field to ionize atoms or molecules of the sample material, and timing means determine the time elapsed between arrival of a secondary electron out of said ionized atoms or molecules at a first predetermined location and arrival of a sample ion out of said ionized atoms or molecules at a second predetermined location.Type: GrantFiled: July 24, 2003Date of Patent: October 19, 2004Assignee: The Regents of the University of CaliforniaInventors: Herbert O. Funsten, William C. Feldman
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Patent number: 6521887Abstract: An ungated, time-of-flight ion mass spectrograph utilizing a continuous ion beam that is rastered (swept) by electrostatic deflection plates at the entrance of a time-of-flight drift tube is described. After an ion is deflected, it follows a trajectory in the drift tube that depends on the phase of the raster and is detected by a position-sensitive detector. The detected position provides information concerning the time when the ion entered the drift tube. This information, when combined with knowledge of the raster voltage at the time that the ion was detected, provides a method for determining the time-of-flight of the ion in the drift tube. Using the time-of-flight and the distance traveled in the drift tube, which is also determined by the detected position of the ion, ion speed is determined. Ion mass-per-charge ratio can then be determined for a monoenergetic ion beam.Type: GrantFiled: May 12, 1999Date of Patent: February 18, 2003Assignee: The Regents of the University of CaliforniaInventors: Herbert O. Funsten, David J. McComas
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Patent number: 5912466Abstract: Apparatus and method for rapid detection of explosives residue from the deflagration signature thereof. A property inherent to most explosives is their stickiness, resulting in a strong tendency of explosive particulate to contaminate the environment of a bulk explosive. An apparatus for collection of residue particulate, burning the collected particulate, and measurement of the ultraviolet emission produced thereby, is described. The present invention can be utilized for real-time screening of personnel, cars, packages, suspected devices, etc., and provides an inexpensive, portable, and noninvasive means for detecting explosives.Type: GrantFiled: June 10, 1997Date of Patent: June 15, 1999Assignee: The Regents of the University of CaliforniaInventors: Herbert O. Funsten, David J. McComas
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Patent number: 5638166Abstract: Apparatus and method for rapid detection of explosives residue from the deflagration signature thereof. A property inherent to most explosives is their stickiness, resulting in a strong tendency of explosive particulate to contaminate the environment of a bulk explosive. An apparatus for collection of residue particulate, burning the collected particulate, and measurement of the optical emission produced thereby is described. The present invention can be utilized for real-time screening of personnel, cars, packages, suspected devices, etc., and provides an inexpensive, portable, and noninvasive means for detecting explosives.Type: GrantFiled: May 18, 1995Date of Patent: June 10, 1997Assignee: The Regents of the University of CaliforniaInventors: Herbert O. Funsten, David J. McComas
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Patent number: 5545894Abstract: The compact hydrogen and helium isotope mass spectrometer of the present invention combines low mass-resolution ion mass spectrometry and beam-foil interaction technology to unambiguously detect and quantify deuterium (D), tritium (T), hydrogen molecule (H.sub.2, HD, D.sub.2, HT, DT, and T.sub.2), .sup.3 He, and .sup.4 He concentrations and concentration variations. The spectrometer provides real-time, high sensitivity, and high accuracy measurements. Currently, no fieldable D or molecular speciation detectors exist. Furthermore, the present spectrometer has a significant advantage over traditional T detectors: no confusion of the measurements by other beta-emitters, and complete separation of atomic and molecular species of equivalent atomic mass (e.g., HD and .sup.3 He).Type: GrantFiled: May 4, 1995Date of Patent: August 13, 1996Assignee: The Regents of the University of CaliforniaInventors: Herbert O. Funsten, David J. McComas, Earl E. Scime