Abstract: A method and arrangement for analyzing specimens pursuant to the X-ray fluorescence analysis method utilizing a beam detector to detect a secondary beam that originates from the specimen that is to be analyzed and upon which is directed a primary X-ray beam, the path of which is adjustable in at least one axis of freedom. The surface of a specimen holder on which the specimen is placed is disposed parallel to, and at a defined distance from, a reference plane at which the primary beam is reflected under total reflection conditions. Subsequently, the path of the primary beam is adjusted relative to the reference plane while simultaneously detecting, with a detector, the radiation spectrum of the secondary beam of the specimen. At a predetermined energy level of the primary beam, a secondary beam intensity maximum, to which is assigned a specific reference angle, is determined.

Abstract: A measuring apparatus for X-ray fluorescence analysis in which the specimen s stimulated by glancing incident radiation and is examined spectrometrically by a detector disposed above the specimen. In the path of rays of the stimulating X-radiation there is disposed a reflector which in operation deflects the X-radiation to the surface of the specimen.

Abstract: A measuring device for X-ray fluorescence analysis, in which a specimen dosed on a carrier is stimulated by glancing incident radiation and examined spectrometrically by a detector which may be arranged above the specimen. On the upper side of an e.g., box-shaped housing in which a vacuum can be created, there is provided a detector extending into the interior of the housing. This detector is connected to the housing by means of a pivotable frame within the housing. The pivot axis of the frame is located in the measuring plane of the detector. Provided on the pivotable frame is a remote controllable specimen exchanger and a remote controllable disengaging device for shifting the specimen carrier out of its operative position, the disengaging device being substantially aligned with the detector axis. The pivotable frame has furthermore provided thereon counter bearings for the specimen carriers; these counter bearings surround the measuring region.