Abstract: An IC transporting device for IC probe apparatus includes a vertical unit, a horizontal unit and a suck-and-hold unit, and capable of being set, change by means of a computer program and controlling to-and-fro moving distance of individual motor so as to accurately position the transporting device, wherein the vertical unit includes a main sliding rail of an appropriate distance and a step motor at the front and rear end, and the main sliding rail is mounted with a dove-tail block having a clipping block with an arch-shaped block; the horizontal unit includes an arch-shaped block having a suspension arm being mounted onto an upright board and a flat board, and the perpendicular face of the upright board has a first step motor and a second step motor, and a common sharing sliding rail is provided on the flat board for left-right movement of a first and a second suck-and-hold device driven by the first and the second step motor; the suck-and-hold unit includes a first suck-and-hold device, and the first suck-an

Abstract: The present invention relates to a system of IC transporting process for IC test device and the method thereof, and in particular, an IC transporting system having a plurality of buffering regions provided at the front end and rear end of the test region of the IC chip. The system comprises an empty tray treating region, feeding region, main buffering region, test region, and distribution region. The present invention makes use of time-differential of transporting IC chip loading trays between the distribution region and the main buffering region to maintain the testing process of IC chips. Thus, the present invention provides a high and efficient productivity.