Abstract: The present invention relates to an improved probe for precisely positioning a probe tip at a measurement point. For this purpose, an image capturing device such as a camera may be firmly arranged at the probe. The image capturing device may capture image data around an area of the probe tip. The captured image data may be provided to a user during positioning the probe tip at the desired measuring point.

Abstract: The present invention relates to an improved probe for precisely positioning a probe tip at a measurement point. For this purpose, an image capturing device such as a camera may be firmly arranged at the probe. The image capturing device may capture image data around an area of the probe tip. The captured image data may be provided to a user during positioning the probe tip at the desired measuring point.

Abstract: The present invention relates to an improved probe for precisely positioning a probe tip at a measurement point. For this purpose, an image capturing device such as a camera may be firmly arranged at the probe. The image capturing device may capture image data around an area of the probe tip. The captured image data may be provided to a user during positioning the probe tip at the desired measuring point.

Abstract: The present invention relates to an improved probe for precisely positioning a probe tip at a measurement point. For this purpose, an image capturing device such as a camera may be firmly arranged at the probe. The image capturing device may capture image data around an area of the probe tip. The captured image data may be provided to a user during positioning the probe tip at the desired measuring point.

Abstract: A probe or measuring head for measuring an electrical signal of an electrical contact has an electrically conducting feeler (1) which protrudes out of a housing (3) and has, at its end, a contact region (4) which comes into touching contact with the electrical contact. The contact region (4) of the feeler (1) and the measurement environment surrounding the contact region (4) of the feeler (1) is illuminated by the light beams from a light source (101, 102, . . . , 10n, 10o) connected to the probe or measuring head.

Abstract: A probe or measuring head for measuring an electrical signal of an electrical contact has an electrically conducting feeler (1) which protrudes out of a housing (3) and has, at its end, a contact region (4) which comes into touching contact with the electrical contact. The contact region (4) of the feeler (1) and the measurement environment surrounding the contact region (4) of the feeler (1) is illuminated by the light beams from a light source (101, 102, . . . , 10n, 10o) connected to the probe or measuring head.

Abstract: A measuring device (e.g., a vectorial network analyzer) by means of at least two ports can be connected to a device under test and has associated excitation/receiving units (ERUs), each thereof having one port. At least one ERU has a signal generator, which can apply an excitation signal onto a device under test. Each ERU possesses two receiving apparatuses (each with a mixer in connection with an oscillator signal) to receive the excitation signal, the reflected signal from the associated port or the signal transmitted to the associated port and converts said signal into an intermediate signal. Each ERU exhibits its own oscillator separate from the signal generator, and generates the oscillator signal for the mixer of the receiving apparatus of the ERU, whereby the frequency and/or phase of the oscillator signals, can be adjusted independently of the frequency and/or phase of oscillator signals of the oscillators of other ERUs.

Abstract: An apparatus for the determination of the magnitude of a noise (TDUT) of an electronic object to be measured (2) includes a sine signal source (1), which generates a sine signal (Sin) for input into said object to be measured (2) and a level meter (3) for the measurement of a power level at the output of the said object to be measured (2). In accord with the invention, the level meter (3) possesses a sine power detector device (31) for the capture of a sine power level ({circumflex over (P)}sin) and has a noise power level detector device (32) for a separate capture of a noise power level ({circumflex over (P)}noise).

Abstract: An apparatus for the determination of the magnitude of a noise (TDUT) of an electronic object to be measured (2) includes a sine signal source (1), which generates a sine signal (Sin) for input into said object to be measured (2) and a level meter (3) for the measurement of a power level at the output of the said object to be measured (2). In accord with the invention, the level meter (3) possesses a sine power detector device (31) for the capture of a sine power level ({circumflex over (P)}sin) and has a noise power level detector device (32) for a separate capture of a noise power level ({circumflex over (P)}noise).

Abstract: With a view to determining the complex transfer function of a measuring instrument, a line spectrum is fed in from a pulse generator which, for example, is constituted by a step-recovery diode, and the digitized output signal arising at the output of the measuring instrument is evaluated in a computer.