Abstract: A multiplier of a binary number A by a binary number B may be configured to add each term AiBj with a left shift by i+j bits, where Ai is the bit of weight i of number A, and Bj the bit of weight j of number B. The multiplier may include a first counter associated with the number A and may count modulo n and be paced by a clock. The multiplier may include a second counter associated with the number B and paced by the clock. Switching circuitry may produce the terms AiBj by taking the content of the first and second counters respectively as weights i and j. Shifting circuitry is configured to shift the content of one of the first and second counters when the other counter has achieved a revolution.

Abstract: A method to estimate parameters of a system to spread a spectrum of a first periodic signal according to a modulation period. An embodiment comprises sampling the first signal using a second periodic signal, determining based on the sampling result each occurrence where the first and second signals are synchronous, incrementing a first counter at each sampling, the first counter being reset at each said occurrence, storing at each said occurrence the last value of the first counter before the resetting, providing a third periodic signal at a first level when said last value is greater than a threshold and at a second level when said last value is smaller than the threshold, and determining the modulation period based on the period of the third signal.

Abstract: A multiplier of a binary number A by a binary number B may be configured to add each term AiBj with a left shift by i+j bits, where Ai is the bit of weight i of number A, and Bj the bit of weight j of number B. The multiplier may include a first counter associated with the number A and may count modulo n and be paced by a clock. The multiplier may include a second counter associated with the number B and paced by the clock. Switching circuitry may produce the terms AiBj by taking the content of the first and second counters respectively as weights i and j. Shifting circuitry is configured to shift the content of one of the first and second counters when the other counter has achieved a revolution.

Abstract: A method of testing a data connection using at least one test sequence, the method including providing a first bit sequence by a first generator; duplicating the first bit sequence to generate a second bit sequence identical to the first; and generating the at least one test sequence based on the first and second bit sequences and transmitting the at least one test sequence over a data connection to be tested.

Abstract: A method for testing an integrated circuit, the method including performing a series of at least three tests, each including: selecting two nodes among at least three nodes for taking a clock signal from an integrated circuit, taking two clock signals at the two selected taking nodes during a test duration, detecting and counting events appearing in a jitter signal between the two clock signals taken, during the test duration, and determining from numbers of events counted a test result proportional to a sum of jitter variances of the two clock signals taken, and at the end of the series of tests, determining by a matrix calculation the jitter variance of each clock signal taken.

Abstract: A method for characterizing jitter of an internal clock signal of a circuit may include generating a series of samples of the internal clock signal by a reference clock signal, comparing the word formed by the N most recent samples of the series to an N-bit pattern, where N is an integer greater than, or equal to 2, and incrementing a first counter if the word complies with the pattern. The method may also include incrementing a second counter when the count of the first counter reaches a first threshold X1, and incrementing a third counter when the count of the first counter reaches a second threshold different from the first. The method may include calculating an average p and a standard deviation ? of a Gaussian density curve as a function of the counts reached in the second and third counters.

Abstract: A method of testing a data connection using at least one test sequence, the method including providing a first bit sequence by a first generator; duplicating the first bit sequence to generate a second bit sequence identical to the first; and generating the at least one test sequence based on the first and second bit sequences and transmitting the at least one test sequence over a data connection to be tested.

Abstract: A method of generating at least one test sequence for testing a data connection, the method involving selectively combining by a logic function (206) the output sequences of a plurality of pseudo-random bit sequence (PRBS) generators (202, 204), each generator having a specific number of states that is different from those of the other generators.

Abstract: A method to estimate parameters of a system to spread a spectrum of a first periodic signal according to a modulation period. An embodiment comprises sampling the first signal using a second periodic signal, determining based on the sampling result each occurrence where the first and second signals are synchronous, incrementing a first counter at each sampling, the first counter being reset at each said occurrence, storing at each said occurrence the last value of the first counter before the resetting, providing a third periodic signal at a first level when said last value is greater than a threshold and at a second level when said last value is smaller than the threshold, and determining the modulation period based on the period of the third signal.

Abstract: A method for testing an integrated circuit, comprising performing a series of at least three tests, each comprising: selecting two nodes among at least three nodes for taking a clock signal from an integrated circuit, taking two clock signals at the two selected taking nodes during a test duration, detecting and counting events appearing in a jitter signal between the two clock signals taken, during the test duration, and determining from numbers of events counted a test result proportional to a sum of jitter variances of the two clock signals taken, and at the end of the series of tests, determining by a matrix calculation the jitter variance of each clock signal taken.

Abstract: A bit detection event within a read period is characterized by sub-dividing each read period into elementary time intervals. Certain ones of the elementary intervals are selected to for a window and a counting operation for a number of bits detected during the intervals within the window is performed. The elementary time intervals are defined by a difference between a frequency corresponding to the read period and a bit detection timing frequency. The counting result for the intervals in the window over several consecutive read periods is statistically processed. A reduction of an integrated electronic circuit test duration results from limiting the counting operations performed to the selected elementary time intervals.

Abstract: A method and a device for estimating the jitter of a first periodic signal with respect to a second periodic signal, comprising steps of: sampling the first signal by means of the second one; providing the result of the sampling to the input of a shift register triggered by the second signal; comparing at least the first two states and the last state of a current word formed from parallel outputs of the shift register with respect to a reference word; and counting the number of occurrences of the reference word within a given measurement period.

Abstract: A method and a device for estimating the jitter of a first periodic signal with respect to a second periodic signal, comprising steps of: sampling the first signal by means of the second one; providing the result of the sampling to the input of a shift register triggered by the second signal; comparing at least the first two states and the last state of a current word formed from parallel outputs of the shift register with respect to a reference word; and counting the number of occurrences of the reference word within a given measurement period.

Abstract: A bit detection event within a read period is characterized by sub-dividing each read period into elementary time intervals. Certain ones of the elementary intervals are selected to for a window and a counting operation for a number of bits detected during the intervals within the window is performed. The elementary time intervals are defined by a difference between a frequency corresponding to the read period and a bit detection timing frequency. The counting result for the intervals in the window over several consecutive read periods is statistically processed. A reduction of an integrated electronic circuit test duration results from limiting the counting operations performed to the selected elementary time intervals.