Abstract: Method for the microdeformation of the front face of a thin part, by modifying the rear face or the periphery of the part. According to the invention, which can notably be used to correct the wave surface of a mirror, a local treatment is applied to the rear face or to the periphery which causes a static microdeformation, which is frozen once and for all, of the front face, without applying any mechanical force to the part.

Abstract: This device comprises for example two screens (20, 22) opaque to radiation and withstanding sprays, and suitable for preventing the radiation and sprays from reaching the eyes (4, 6) of a user, and a device (24) for acquiring an image of a scene (8) and restoring the image to the user, comprising at least one image-formation optical device (26) rigidly secured to the screen (20) and associated with an imaging device (28) for acquiring the image of the scene (8), and at least one restoration device (30) for restoring the acquired image to the user. According to the invention, this restoration device comprises a device for projecting the image of the scene into the eye of the user.

Abstract: A method for measuring a wave surface of an optical component formed of a stack of at least two layers of different refraction indices from reflection or transmission measurements of points located on a face of the said optical component.

Abstract: Method for the microdeformation of the front face of a thin part, by modifying the rear face or the periphery of the part. According to the invention, which can notably be used to correct the wave surface of a mirror, a local treatment is applied to the rear face or to the periphery which causes a static microdeformation, which is frozen once and for all, of the front face, without applying any mechanical force to the part.

Abstract: A method for measuring a wave surface of an optical component formed of a stack of at least two layers of different refraction indices from reflection or transmission measurements of points located on a face of the said optical component.

Abstract: Embodiments relate to a device for measuring characterisation by reflectometry including a source that emits a light beam, a detector, optics for processing and controlling this light beam so as to focus it on a reflective surface to be measured in the form of a spot and to receive it on the detector, command and acquisition modules, a camera and modules for imaging the spot on the detector and on the camera, wherein the camera is connected to the command and acquisition means so as to automatically focus the spot on the reflective surface to be measured and to automatically conjugate the reflective surface to be measured with the surface of the detector.

Abstract: The invention relates to a device for measuring characterisation by reflectometry including a source that emits a light beam, a detector, means for processing and controlling this light beam so as to focus it on a reflective surface to be measured in the form of a spot and to receive it on said detector, command and acquisition means, a camera and means for imaging said spot on said detector and on said camera, wherein said camera is connected to the command and acquisition means so as to automatically focus the spot on the reflective surface to be measured and to automatically conjugate the reflective surface to be measured with the surface of the detector.