Patents by Inventor Herve Piombini

Herve Piombini has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for the microdeformation of the front face of a thin part by modifying the rear face or the periphery of the part
    Patent number: 9375805
    Abstract: Method for the microdeformation of the front face of a thin part, by modifying the rear face or the periphery of the part. According to the invention, which can notably be used to correct the wave surface of a mirror, a local treatment is applied to the rear face or to the periphery which causes a static microdeformation, which is frozen once and for all, of the front face, without applying any mechanical force to the part.
    Type: Grant
    Filed: October 11, 2010
    Date of Patent: June 28, 2016
    Assignee: Commissariat a L'Energie Atomique et aux Energies Alternatives
    Inventors: Herve Piombini, David Damiani
  • METHOD FOR THE MICRODEFORMATION OF THE FRONT FACE OF A THIN PART BY MODIFYING THE REAR FACE OR THE PERIPHERY OF THE PART
    Publication number: 20120201957
    Abstract: Method for the microdeformation of the front face of a thin part, by modifying the rear face or the periphery of the part. According to the invention, which can notably be used to correct the wave surface of a mirror, a local treatment is applied to the rear face or to the periphery which causes a static microdeformation, which is frozen once and for all, of the front face, without applying any mechanical force to the part.
    Type: Application
    Filed: October 11, 2010
    Publication date: August 9, 2012
    Applicant: COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES
    Inventors: Herve Piombini, David Damiani
  • Device and process for measuring the characterisation by reflectometry
    Patent number: 7773208
    Abstract: Embodiments relate to a device for measuring characterisation by reflectometry including a source that emits a light beam, a detector, optics for processing and controlling this light beam so as to focus it on a reflective surface to be measured in the form of a spot and to receive it on the detector, command and acquisition modules, a camera and modules for imaging the spot on the detector and on the camera, wherein the camera is connected to the command and acquisition means so as to automatically focus the spot on the reflective surface to be measured and to automatically conjugate the reflective surface to be measured with the surface of the detector.
    Type: Grant
    Filed: May 29, 2007
    Date of Patent: August 10, 2010
    Assignee: Commissariat a l'Energie Atomique
    Inventors: Herve Piombini, Philippe Voarino
  • DEVICE AND PROCESS FOR MEASURING THE CHARACTERIZATION BY REFLECTOMETRY
    Publication number: 20090116022
    Abstract: The invention relates to a device for measuring characterisation by reflectometry including a source that emits a light beam, a detector, means for processing and controlling this light beam so as to focus it on a reflective surface to be measured in the form of a spot and to receive it on said detector, command and acquisition means, a camera and means for imaging said spot on said detector and on said camera, wherein said camera is connected to the command and acquisition means so as to automatically focus the spot on the reflective surface to be measured and to automatically conjugate the reflective surface to be measured with the surface of the detector.
    Type: Application
    Filed: May 29, 2007
    Publication date: May 7, 2009
    Applicant: COMMISSARIAT A L'ENERGIE ATOMIQUE
    Inventors: Herve Piombini, Philippe Voarino