Patents by Inventor Herve-William Remigy
Herve-William Remigy has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 10672587Abstract: A method of preparing a cryogenic sample (e.g. for study in a charged-particle microscope), whereby the sample is subjected to rapid cooling using a cryogen, comprising the following steps: Providing two conduits for transporting cryogenic fluid, each of which conduits opens out into a mouthpiece, which mouthpieces are arranged to face each other across an intervening gap; Placing the sample in said gap; Pumping cryogenic fluid through said conduits so as to concurrently flush from said mouthpieces, thereby suddenly immersing the sample in cryogenic fluid from two opposite sides, wherein the flush of cryogenic fluid applied from a first of said mouthpieces is different—e.g. has a different duration—to that applied from the second of said mouthpieces.Type: GrantFiled: December 5, 2018Date of Patent: June 2, 2020Assignee: FEI CompanyInventor: Hervé-William Rémigy
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Publication number: 20190180974Abstract: A method of preparing a cryogenic sample (e.g. for study in a charged-particle microscope), whereby the sample is subjected to rapid cooling using a cryogen, comprising the following steps: Providing two conduits for transporting cryogenic fluid, each of which conduits opens out into a mouthpiece, which mouthpieces are arranged to face each other across an intervening gap; Placing the sample in said gap; Pumping cryogenic fluid through said conduits so as to concurrently flush from said mouthpieces, thereby suddenly immersing the sample in cryogenic fluid from two opposite sides, wherein the flush of cryogenic fluid applied from a first of said mouthpieces is different—e.g. has a different duration—to that applied from the second of said mouthpieces.Type: ApplicationFiled: December 5, 2018Publication date: June 13, 2019Inventor: Hervé-William Rémigy
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Patent number: 9865428Abstract: A method of preparing a sample for study in a charged-particle microscope, whereby the sample is subjected to rapid cooling using a cryogen, comprising the following steps: Providing two conduits for transporting cryogenic fluid, each of which conduits opens out into a mouthpiece, which mouthpieces are arranged to face each other across an intervening gap; Placing the sample in said gap; Pumping cryogenic fluid through said conduits so as to concurrently flush from said mouthpieces, thereby suddenly immersing the sample in cryogenic fluid from two opposite sides.Type: GrantFiled: July 25, 2016Date of Patent: January 9, 2018Assignee: FEI CompanyInventor: Herve-William Remigy
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Patent number: 9772265Abstract: A system and method for preparing a sample for study in a charged-particle microscope is disclosed. A sample holder comprises substantially parallel opposing faces connected by apertures spanned by a perforated membrane. Blotting material is placed against the outer membrane surface, and liquid films may then be deposited onto the inner membrane surface within each aperture where each aperture can contain a unique sample. Liquids from each sample flow through the perforations in the membrane to be absorbed by the blotting material. After completion of deposition of liquid samples, the sample holder is raised off the blotting material, leaving aqueous samples within the perforations of the membrane. The sample holder may then be immersed in a vitrifying bath of liquid oxygen to form a cryo-sample for microscopic imaging and analysis.Type: GrantFiled: February 24, 2016Date of Patent: September 26, 2017Assignee: FEI CompanyInventor: Hervé-William Rémigy
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Publication number: 20170169991Abstract: A method of preparing a sample for study in a charged-particle microscope, whereby the sample is subjected to rapid cooling using a cryogen, comprising the following steps: Providing two conduits for transporting cryogenic fluid, each of which conduits opens out into a mouthpiece, which mouthpieces are arranged to face each other across an intervening gap; Placing the sample in said gap; Pumping cryogenic fluid through said conduits so as to concurrently flush from said mouthpieces, thereby suddenly immersing the sample in cryogenic fluid from two opposite sides.Type: ApplicationFiled: July 25, 2016Publication date: June 15, 2017Applicant: FEI CompanyInventor: Herve-William Remigy
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Publication number: 20160245732Abstract: A system for preparing a sample for study in a charged-particle microscope by: Providing a substantially planar sample holder having opposed faces substantially parallel to one another, comprising at least one aperture that connects said faces and across which a membrane has been mounted, which membrane comprises at least one perforation; Spanning a film of aqueous liquid across said perforation, which liquid comprises at least one study specimen suspended therein; Prior to said spanning step, placing a blotting sheet of blotting material in intimate contact with a first surface of said membrane, at a side distal from said sample holder; Depositing said aqueous liquid through said aperture and onto a second surface of said membrane, opposite said first surface; and Subsequently removing said blotting sheet from said membrane.Type: ApplicationFiled: February 24, 2016Publication date: August 25, 2016Applicant: FEI CompanyInventor: Hervé-William Rémigy
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Patent number: 9116091Abstract: A method of preparing a sample for a charged-particle microscope includes: Providing a substantially plate-like sample holder having opposed first and second major surfaces substantially parallel to one another, comprising at least one aperture connecting said major surfaces and across which a membrane has been spanned upon said first major surface, which membrane comprises at least one perforation; Spanning a film of liquid across said perforation, which liquid comprises at least one study specimen suspended therein; Plunging the sample holder onto a bath of cryogen, whereby the sample holder is held with said first major surface pointing toward the cryogen and arranged substantially parallel to an exposed surface of the cryogen; and Applying a blast of cryogenic fluid to said film from a nozzle pointing toward said second major surface, immediately prior to the film making contact with said cryogen. A corresponding apparatus is also described.Type: GrantFiled: September 26, 2014Date of Patent: August 25, 2015Assignee: FEI COMPANYInventors: Hervé-William Rémigy, Karin Smulders-Weemers, Mikhail Mikhaylovich Ovsyanko, Frank Nijpels, Kasim Stefan Sader
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Publication number: 20150090878Abstract: A method of preparing a sample for a charged-particle microscope includes: Providing a substantially plate-like sample holder having opposed first and second major surfaces substantially parallel to one another, comprising at least one aperture connecting said major surfaces and across which a membrane has been spanned upon said first major surface, which membrane comprises at least one perforation; Spanning a film of liquid across said perforation, which liquid comprises at least one study specimen suspended therein; Plunging the sample holder onto a bath of cryogen, whereby the sample holder is held with said first major surface pointing toward the cryogen and arranged substantially parallel to an exposed surface of the cryogen; and Applying a blast of cryogenic fluid to said film from a nozzle pointing toward said second major surface, immediately prior to the film making contact with said cryogen. A corresponding apparatus is also described.Type: ApplicationFiled: September 26, 2014Publication date: April 2, 2015Applicant: FEI CompanyInventors: Hervé-William Rémigy, Karin Smulders-Weemers, Mikhail Mikhaylovich Ovsyanko, Frank Nijpels, Kasim Stefan Sader
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Patent number: 8757873Abstract: A method of determining the temperature of a sample carrier in a charged particle-optical apparatus, characterized in that the method comprises the observation of the sample carrier with a beam of charged particles, the observation giving information about the temperature of the sample carrier. The invention is based on the insight that a charged particle optical apparatus, such as a TEM, STEM, SEM or FIB, can be used to observe temperature related changes of a sample carrier. The changes may be mechanical changes (e.g. of a bimetal), crystallographic changes (e.g. of a perovskite), and luminescent changes (in intensity or decay time). In a preferred embodiment the sample carrier shows two bimetals, showing metals with different thermal expansion coefficients, bending in opposite directions. The distance between the two bimetals is used as a thermometer.Type: GrantFiled: November 23, 2011Date of Patent: June 24, 2014Assignee: FEI CompanyInventors: Stephanus Hubertus Leonardus van den Boom, Pleun Dona, Laurens Franz Taemsz Kwakman, Uwe Luecken, Hervé-William Rémigy, Hendrik Nicolaas Slingerland, Martin Verheijen, Gerbert Jeroen van de Water
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Publication number: 20120128028Abstract: A method of determining the temperature of a sample carrier in a charged particle-optical apparatus, characterized in that the method comprises the observation of the sample carrier with a beam of charged particles, the observation giving information about the temperature of the sample carrier. The invention is based on the insight that a charged particle optical apparatus, such as a TEM, STEM, SEM or FIB, can be used to observe temperature related changes of a sample carrier. The changes may be mechanical changes (e.g. of a bimetal), crystallographic changes (e.g. of a perovskite), and luminescent changes (in intensity or decay time). In a preferred embodiment the sample carrier shows two bimetals, showing metals with different thermal expansion coefficients, bending in opposite directions. The distance between the two bimetals is used as a thermometer.Type: ApplicationFiled: November 23, 2011Publication date: May 24, 2012Applicant: FEI CompanyInventors: Stephanus Hubertus Leonardus van den Boom, Pleun Dona, Laurens Franz Taemsz Kwakman, Uwe Luecken, Hervé-William Rémigy, Hendrik Nicolaas Slingerland, Martin Verheijen, Gerbert Jeroen van der Water