Patents by Inventor Hesamaldin Mazidisharfabadi

Hesamaldin Mazidisharfabadi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Methods for quantifying and enhancing accuracy in microscopy using measures of localization confidence
    Patent number: 11300515
    Abstract: Systems and methods assessing the accuracy of at least one localization from a single molecule localization microscopy (SMLM) dataset containing a plurality of localizations are described. The systems and methods calculate a Wasserstein-induced flux (WIF) value indicative of a confidence in the accuracy of a localization within the SMLM data set.
    Type: Grant
    Filed: July 30, 2020
    Date of Patent: April 12, 2022
    Assignee: Washington University
    Inventors: Matthew Lew, Arye Nehorai, Hesamaldin Mazidisharfabadi
  • METHODS FOR QUANTIFYING AND ENHANCING ACCURACY IN MICROSCOPY USING MEASURES OF LOCALIZATION CONFIDENCE
    Publication number: 20210033536
    Abstract: Systems and methods assessing the accuracy of at least one localization from a single molecule localization microscopy (SMLM) dataset containing a plurality of localizations are described. The systems and methods calculate a Wasserstein-induced flux (WIF) value indicative of a confidence in the accuracy of a localization within the SMLM data set.
    Type: Application
    Filed: July 30, 2020
    Publication date: February 4, 2021
    Applicant: Washington University
    Inventors: Matthew Lew, Arye Nehorai, Hesamaldin Mazidisharfabadi