Patents by Inventor Heung-Bin Lim

Heung-Bin Lim has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Microparticles for analyzing biomolecules, method for preparing same, kit for analyzing biomolecules, and method for analyzing biomolecules using the kit
    Patent number: 10281461
    Abstract: The present invention relates to microparticles for analyzing biomolecules, a biomolecule analysis kit comprising the microparticles, and a method for analyzing biomolecules using the analysis kit, the microparticles for analyzing biomolecules comprising: a core including at least one selected from among an optical expression substance, a metallic material, and a magnetic material; a silica coating layer formed on the core; and at least one binding means, linked to the silica coating layer, for binding to an analysis subject biomolecule, wherein the optical expression substance is a fluorescent or a luminescent.
    Type: Grant
    Filed: August 26, 2013
    Date of Patent: May 7, 2019
    Assignees: INDUSTRY-ACADEMIC COOPERATION FOUNDATION, DANKOOK UNIVERSITY, Specialty Lab Solution Bio Co.
    Inventor: Heung Bin Lim
  • Microparticles for analyzing biomolecules, method for preparing same, kit for analyzing biomolecules, and method for analyzing biomolecules using the kit
    Publication number: 20150219640
    Abstract: The present invention relates to microparticles for analyzing biomolecules, a biomolecule analysis kit comprising the microparticles, and a method for analyzing biomolecules using the analysis kit, the microparticles for analyzing biomolecules comprising: a core including at least one selected from among an optical expression substance, a metallic material, and a magnetic material; a silica coating layer formed on the core; and at least one binding means, linked to the silica coating layer, for binding to an analysis subject biomolecule, wherein the optical expression substance is a fluorescent or a luminescent.
    Type: Application
    Filed: August 26, 2013
    Publication date: August 6, 2015
    Inventor: Heung Bin Lim
  • MEASUREMENT METHOD AND MEASUREMENT KIT OF ANTIBIOTICS CONCENTRATION
    Publication number: 20140093982
    Abstract: A method and kit for measuring a concentration of an antibiotic are provided. The method of measuring a concentration of an antibiotic includes preparing magnetic particles bound to an antibiotic, preparing silica-coated fluorescent particles to which at least one antibody of the antibiotic is bound, allowing the magnetic particles to react with the silica-coated fluorescent particles, and irradiating the reacted silica-coated fluorescent particles with laser beams.
    Type: Application
    Filed: September 27, 2013
    Publication date: April 3, 2014
    Applicants: Republic of Korea (Ministry of Food and Drug Safety), Industry-Academic Cooperation Foundation, Dankook University
    Inventors: Heung Bin Lim, Jung Ah Ko, Su Ji Kim, Ki Hwan Park, Kyu Heon Kim, Hwa Jung Lee, Sang Bae Han
  • Apparatus and method for analyzing contaminants on wafer
    Patent number: 7880138
    Abstract: Provided is an apparatus and method for analyzing contaminants on a wafer. The apparatus includes: a wafer holder for supporting a wafer on which contaminants to be analyzed are located, a laser ablation device for irradiating a laser to the wafer to extract a discrete specimen from the wafer, an analysis cell for collecting a discrete specimen from the surface of the wafer by irradiating the laser, and an analysis device connected to the analysis cell for analyzing contaminants from the collected discrete specimen.
    Type: Grant
    Filed: December 21, 2007
    Date of Patent: February 1, 2011
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Jae-Seok Lee, Heung-Bin Lim, Won-Kyung Ryu, Seung-Ki Chae, Yang-Koo Lee, Hun-Jung Yi
  • APPARATUS AND METHOD FOR ANALYZING CONTAMINANTS ON WAFER
    Publication number: 20080149827
    Abstract: Provided is an apparatus and method for analyzing contaminants on a wafer. The apparatus includes: a wafer holder for supporting a wafer on which contaminants to be analyzed are located, a laser ablation device for irradiating a laser to the wafer to extract a discrete specimen from the wafer, an analysis cell for collecting a discrete specimen from the surface of the wafer by irradiating the laser, and an analysis device connected to the analysis cell for analyzing contaminants from the collected discrete specimen.
    Type: Application
    Filed: December 21, 2007
    Publication date: June 26, 2008
    Applicants: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Jae-Seok LEE, Heung-Bin LIM, Won-Kyung RYU, Seung-Ki CHAE, Yang-Koo LEE, Hun-Jung YI