Patents by Inventor Hidde Herman Brongersma

Hidde Herman Brongersma has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Device for analyzing a surface layer by means of ion scattering
    Patent number: 4100409
    Abstract: A device for analysing a surface layer by means of ion scattering. The device comprises an energy selector having two coaxial cylindrical electrodes. A primary mono-energetic ion beam impinges upon the surface layer and its axis coincides with the axis of the cylindrical electrodes. Back-scattered ions, the paths of which lie on a conical surface having an apical angle of 180.degree. reduced with the scattering angle, are selected for energy and detected.
    Type: Grant
    Filed: November 1, 1976
    Date of Patent: July 11, 1978
    Assignee: U.S. Phillips Corporation
    Inventor: Hidde Herman Brongersma
  • Device for mass analysis and structure analysis of a surface layer by means of ion scattering
    Patent number: 3970849
    Abstract: A device utilizing an energy analyzer having two coaxial cylindrical electrodes, a coaxial ring-shaped detector comprising a large number of individual detector elements to provide information on the atomic structure of the surface layer.
    Type: Grant
    Filed: November 19, 1974
    Date of Patent: July 20, 1976
    Assignee: U.S. Philips Corporation
    Inventors: Hidde Herman Brongersma, Jacob Walinga