Abstract: A fan apparatus includes an impeller, a motor rotating the impeller, a plurality of stator blades arranged opposite to the impeller in an axial direction. The stator blades each include a curved portion at which the stator blades each are curved with respect to the direction in which the stator blades extend.

Abstract: A centrifugal fan includes a motor having an impeller and a housing for accommodating the motor. The housing has a sidewall surrounding an outer circumference of the impeller. An air inlet is formed in the housing and opposed to a center portion of the impeller. An air outlet is formed in the sidewall of the housing and opposed to an outer surface of the impeller. The housing includes a housing body and a housing cover. The housing body has a bottom with the motor secured thereon. The housing cover, formed by a pressed metal member, has an upper part and a cover sidewall extending from the upper part toward the bottom of the housing body and forming at least a part of the sidewall of the housing.

Abstract: An arrangement of a low air inlet and a circuit for driving a torque generator in an ultra-compact centrifugal fan is disclosed. In the ultra-compact centrifugal fan, a region occupied by the circuit is not completely arranged radially inside a cup-shaped portion to which an impeller is attached. At least a part of the low air inlet provided on a bottom of a housing of the centrifugal fan is arranged in a range of predetermined angle in an imaginary ring-shaped portion surrounding a base portion covered by the cup-shaped portion. A part of the circuit, that is not covered by the cup-shaped portion, is arranged upstream of the range of the predetermined angle in a flowing direction of airflow.

Abstract: An apparatus enables a high quality test to be carried out within a short time, without forcing a severe design limitation on the designer and without an expensive tester. The apparatus includes a pattern generator built in an integrated circuit to generate pseudo random patterns as test patterns. A plurality of shift registers are configured with sequential circuit elements inside said integrated circuit. An automatic test pattern generating unit generates ATPG patterns. A pattern modifier modifies a portion, to which a predetermined value is required to be set in order to detect a fault, in said pseudo random patterns generated by said pattern generator, on a basis of said ATPG patterns, and inputs said modified pseudo random patterns to said shift registers.

Abstract: An apparatus enables a high quality test to be carried out within a short time, without forcing a severe design limitation on the designer and without an expensive tester. The apparatus includes a pattern generator built in an integrated circuit to generate pseudo random patterns as test patterns. A plurality of shift registers are configured with sequential circuit elements inside said integrated circuit. An automatic test pattern generating unit generates ATPG patterns. A pattern modifier modifies a portion, to which a predetermined value is required to be set in order to detect a fault, in said pseudo random patterns generated by said pattern generator, on a basis of said ATPG patterns, and inputs said modified pseudo random patterns to said shift registers.

Abstract: In manufacturing of the stator unit 2 according to one preferred embodiment of the present invention, a plurality of terminal pins are arranged in an axially spaced manner from a plurality of the coils during a twining process of the wires from the coils 232 to the terminal pins 241. Then, after the wire is twined to the terminal pins, the terminal pins connected to the coils are moved along the outer side face of the sleeve housing, functioning to as a guide portion for the terminal pins. By virtue of the configuration, the terminal pins 241 may be approximated to the coils without applying the tension on wire, and the stator unit may be made thin with preventing the open circuit of the wires.

Abstract: In an apparatus for supporting test pattern generation, when an acquiring unit acquires connection information of a target circuit to be tested and an untested path, a detecting unit detects paths between all flip-flop cells in the target circuit to create an untested path list. A path extracting unit extracts tested paths and creates a tested path list. A search unit creates a search-result list. A cell extracting unit extracts an untested cell and changes end flags of the untested paths including the untested cell extracted from “0” to “1”. When all end flags in the untested path list are changed to “1”, a correcting unit corrects the connection information, so that a dummy buffer is inserted and connected to a data pin of the untested cell.

Abstract: A test circuit tester includes a scan-chain input-output information generator that generates information for an input and an output of the scan chain that is scan-chain input-output information, based on input information for the scan chain; a test-circuit input-output information generator that generates information for an input and an output of the test circuit that is test-circuit input-output information, based on the scan-chain input-output information; an output unit that outputs the test-circuit input-output information generated; and a verifying unit that verifies the test circuit based on an output pattern output from the test circuit through the scan chains in response to input of the information for the input of the test circuit output to the test circuit, and the information for the output from the test circuit.

Abstract: A centrifugal fan includes an impeller that rotates inside the elongated cylindrical housing and a motor for driving the impeller. The impeller and the motor are arranged tandem in the axial direction. The impeller includes a blade portion having plural blades elongated in the axial direction, and the blades are arranged at a predetermined pitch in the circumferential direction. When the impeller rotates, air is taken in through a suction opening provided to the tip portion in the axial direction of the housing and is blown out through an outlet opening that is provided to a part in the circumferential direction of the housing. A bearing portion that constitutes the motor is a sleeve bearing including a shaft member and a sleeve having a cylindrical shape that engages the shaft member with a clearance. One of the shaft member and the sleeve is fixed to a rotational member, while the other is fixed to a base member.

Abstract: A centrifugal fan includes an impeller including a blade portion having plural elongated blades arranged at a predetermined pitch in the circumferential direction and a motor for rotating the impeller. The impeller and the motor are arranged side by side in the axial direction. A diameter of the impeller is less than or equal to 25 millimeters. A radius r of the impeller and a length h in the axial direction of the impeller satisfies the relationship of 2r<=h<=20r. Among elements that constitute the motor, a torque generating portion including an armature and a field magnet, and a bearing portion that retains a rotational member in a rotatable manner to a fixed member are arranged side by side in the axial direction.

Abstract: A design support apparatus includes a unit that inputs a user net list created by using hard macro cells excluding test circuits, and a unit that arranges hard macro cells using a frame into which hard macro cells, where timing-converged physical information includes test terminals, and test circuits are embedded as arrangement/wiring information. Moreover, includes a unit that arranges and wires the test circuits using the arrangement/wiring information of the test circuit embedded into the frame, a unit that recognizes arrangement/wiring information where the arrangement/wiring information of the test circuits is removed from arrangement/wiring information obtained by wiring, and a unit outputs a net list of a logic structure.

Abstract: An apparatus enables a high quality test to be carried out within a short time, without forcing a severe design limitation on the designer and without an expensive tester. The apparatus comprises a pattern generator built in an integrated circuit to generate a test pattern, a plurality of shift registers configured with sequential circuit elements F/Fs inside the integrated circuit, and a pattern modifier modifying the test pattern generated by the pattern generator according to an external input, and inputting it to the plural shift registers. The apparatus is used as a testing apparatus for detecting manufacturing failure of an integrated circuit such as an LSI (Large Scale Integration) or the like.

Abstract: An apparatus for detecting the flow amount of a fluid passing through a passage. The apparatus comprises a scroll chamber having a circular horizontal cross section and having an inlet opening defined in a tangential direction of the scroll chamber and an outlet opening defined at a substantial center portion of a bottom surface of the scroll chamber. The fluid is introduced through the inlet opening and discharged from the outlet opening. In the scroll chamber, a conically protruding member is provided on a substantial center portion of the top surface of the scroll chamber so as to be protruded vertically and downwardly along the axis of the scroll chamber. A spheral member encased in the scroll chamber is turned about the protruding member and along a wall of the scroll chamber in response to introduction of the fluid through the inlet opening. The flow amount of fluid is measured by detecting the number of turns of the spheral member.