Patents by Inventor Hideaki Nagasawa

Hideaki Nagasawa has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20040139409
    Abstract: An automatic circuit design apparatus includes an analyzer (11) for analyzing a file in a form of a table, in which both connection conditions concerning a plurality of circuit components (e.g., intellectual properties) within an integrated circuit and connections among the plurality of circuit components corresponding to the connection conditions are described, and a description creating unit (12) for creating a description of the integrated circuit according to HDL based on analytical results from the analyzer (11).
    Type: Application
    Filed: December 24, 2003
    Publication date: July 15, 2004
    Applicants: Renesas Technology Corp., Renesas Device Design Corp.
    Inventors: Hideaki Nagasawa, Yasushi Okamoto, Masatsugu Murai, Naoki Hasegawa
  • Patent number: 6710625
    Abstract: In a semiconductor integrated circuit having a gate array structure, within a cell, isolation transistors are disposed in series between an intra-cell gate output terminal and an intra-cell power supply wiring section, or between the intra-cell gate output terminal and an intra-cell ground wiring section. Isolation transistors are disposed in series between an extra-cell gate output terminal and an extra-cell power supply wiring section between cells, or between the extra-cell gate output terminal and an extra-cell ground wiring section.
    Type: Grant
    Filed: May 22, 2002
    Date of Patent: March 23, 2004
    Assignee: Mitsubishi Denki Kabushiki Kaisha
    Inventors: Yutaka Uneme, Hideaki Nagasawa
  • Publication number: 20030117168
    Abstract: In the semiconductor integrated circuit of a gate array structure, within a cell, a plurality of isolation transistors are disposed in series between an intra-cell gate output terminal and an intra-cell power supply wiring section, or between the intra-cell gate output terminal and an intra-cell ground wiring section. While between cells, a plurality of isolation transistors are disposed in series between an extra-cell gate output terminal and an extra-cell power supply wiring section, or between the extra-cell gate output terminal and an extra-cell ground wiring section.
    Type: Application
    Filed: May 22, 2002
    Publication date: June 26, 2003
    Applicant: Mitsubishi Denki Kabushiki Kaisha
    Inventors: Yutaka Uneme, Hideaki Nagasawa
  • Patent number: 5945883
    Abstract: A circuit for suppressing period jitter of the clock output of a ring oscillator caused by supply voltage fluctuations. The ring oscillator includes n identical current controlled delay circuits 26.1-n connected in a ring, and a replica circuit 36 identical to the current controlled delay circuit. The replica circuit 36 receives a constant input voltage so that its output is always at a high level. A differential amplifier 35 receiving a reference potential Vref is connected in a negative feedback circuit with replica circuit 36, so that the output of the replica circuit 36 is held equal to the reference potential Vref. An output of the negative feedback circuit is also applied to each of the current controlled delay circuits 26.1-n, so that their high level outputs are held equal to the reference potential Vref.
    Type: Grant
    Filed: December 5, 1997
    Date of Patent: August 31, 1999
    Assignee: Mitsubishi Denki Kabushiki Kaisha
    Inventors: Hideaki Nagasawa, Atsuhiko Ishibashi