Patents by Inventor Hidechiyo Tanaka

Hidechiyo Tanaka has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Fault diagnosis apparatus and fault diagnosis method of multi-channel analog input/output circuit
    Patent number: 8386862
    Abstract: A fault diagnosis apparatus and method capable of simultaneously detecting the fault of a multiplexer and the fault of an A/D converter and isolating and identifying causes of these faults, the multiplexer and the A/D converter being used in a multi-channel analog input/output circuit. Test-voltage values are inputted from a diagnosis-voltage input unit into the multiplexer and the A/D converter constituting an analog-signal conversion unit, the multiplexer having plural channels, the A/D converter converting outputs from the multiplexer into digital signals, the test-voltage values being different from each other for each channel of the multiplexer. Comparisons are made between the digital voltage values and the test-voltage values inputted, the digital voltage values being outputted for each channel of the multiplexer. From this comparison result, it is judged whether the multiplexer is at fault or the A/D converter is at fault.
    Type: Grant
    Filed: February 18, 2010
    Date of Patent: February 26, 2013
    Assignee: Hitachi, Ltd.
    Inventors: Hisashi Terae, Masakazu Ishikawa, Yasuyuki Furuta, Katsumi Yoshida, Atsushi Nishioka, Yasuhiro Kiyofuji, Takenori Kasahara, Syuichi Nagayama, Fujiya Kawawa, Manabu Kubota, Tatsuyuki Ootani, Hidechiyo Tanaka
  • FAULT DIAGNOSIS APPARATUS AND FAULT DIAGNOSIS METHOD OF MULTI-CHANNEL ANALOG INPUT/OUTPUT CIRCUIT
    Publication number: 20100235699
    Abstract: A fault diagnosis apparatus and method capable of simultaneously detecting the fault of a multiplexer and the fault of an A/D converter and isolating and identifying causes of these faults, the multiplexer and the A/D converter being used in a multi-channel analog input/output circuit. Test-voltage values are inputted from a diagnosis-voltage input unit into the multiplexer and the A/D converter constituting an analog-signal conversion unit, the multiplexer having plural channels, the A/D converter converting outputs from the multiplexer into digital signals, the test-voltage values being different from each other for each channel of the multiplexer. Comparisons are made between the digital voltage values and the test-voltage values inputted, the digital voltage values being outputted for each channel of the multiplexer. From this comparison result, it is judged whether the multiplexer is at fault or the A/D converter is at fault.
    Type: Application
    Filed: February 18, 2010
    Publication date: September 16, 2010
    Inventors: Hisashi TERAE, Masakazu Ishikawa, Yasuyuki Furuta, Katsumi Yoshida, Atsushi Nishioka, Yasuhiro Kiyofuji, Takenori Kasahara, Syuichi Nagayama, Fujiya Kawawa, Manabu Kubota, Tatsuyuki Ootani, Hidechiyo Tanaka